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7024L70GGI8 Datasheet(PDF) 6 Page - Integrated Device Technology |
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7024L70GGI8 Datasheet(HTML) 6 Page - Integrated Device Technology |
6 / 22 page 6.42 IDT7024S/L High-Speed 4K x 16 Dual-Port Static RAM Military, Industrial and Commercial Temperature Ranges 6 DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range(1)(con’t.) (VCC = 5.0V ± 10%) Data Retention Characteristics Over All Temperature Ranges (L Version Only) (VLC = 0.2V, VHC = VCC - 0.2V)(4) NOTES: 1. 'X' in part number indicates power rating (S or L) 2. VCC = 5V, TA = +25°C, and are not production tested. 3. At f = fMAX , address and I/O'S are cycling at the maximum frequency read cycle of 1/tRC, and using “AC Test Conditions”of input levels of GND to 3V. 4. f = 0 means no address or control lines change. 5. Port "A" may be either left or right port. Port "B" is the opposite from port "A". NOTES: 1. TA = +25°C, VCC = 2V, and are by device characterization but are not production tested. 2. tRC = Read Cycle Time 3. This parameter is guaranteed but not tested. 4 . At Vcc < 2.0V, input leakages are not defined. 7024X35 Com'l & Military 7024X55 Com'l, Ind & Military 7024X70 Military Only Symbol Parameter Test Condition Version Typ.(2) Max. Typ.(2) Max. Typ.(2) Max. Unit ICC Dynamic Operating Current (Both Ports Active) CE = VIL, Outputs Disabled SEM = VIH f = fMAX (3) COM'L S L 150 150 250 210 150 150 250 210 ____ ____ ____ ____ mA MIL & IND S L 150 150 300 250 150 150 300 250 140 140 300 250 ISB1 Standby Current (Both Ports - TTL Level Inputs) CER = CEL = VIH SEMR = SEML = VIH f = fMAX (3) COM'L S L 13 13 60 50 13 13 60 50 ____ ____ ____ ____ mA MIL & IND S L 13 13 80 65 13 13 80 65 10 10 80 65 ISB2 Standby Current (One Port - TTL Level Inputs) CE"A" = VIL and CE"B" = VIH(5) Active Port Outputs Disabled, f=fMAX (3) SEMR = SEML = VIH COM'L S L 85 85 155 130 95 95 155 130 ____ ____ ____ ____ mA MIL & IND S L 85 85 190 160 95 95 190 160 80 80 190 160 ISB3 Full Standby Current (Both Ports - CMOS Level Inputs) Both Ports CEL and CER > VCC - 0.2V, VIN > VCC - 0.2V or VIN < 0.2V, f = 0 (4) SEMR = SEML > VCC - 0.2V COM'L S L 1.0 0.2 15 5 1.0 0.2 15 5 ____ ____ ____ ____ mA MIL & IND S L 1.0 0.2 30 10 1.0 0.2 30 10 1.0 0.2 30 10 ISB4 Full Standby Current (One Port - CMOS Level Inputs) CE"A" < 0.2V and CE"B" > VCC - 0.2V(5) SEMR = SEML > VCC - 0.2V VIN > VCC - 0.2V or VIN < 0.2V Active Port Outputs Disabled, f = fMAX(3) COM'L S L 80 80 135 110 80 80 135 110 ____ ____ ____ ____ mA MIL & IND S L 80 80 175 150 80 80 175 150 75 75 175 150 2740 tbl 09b Symbol Parameter Test Condition Min. Typ. (1) Max. Unit VDR VCC for Data Retention VCC = 2V 2.0 ___ ___ V ICCDR Data Retention Current CE > VHC VIN > VHC or < VLC MIL. & IND. ___ 100 4000 µA COM'L. ___ 100 1500 tCDR (3) Chip Deselect to Data Retention Time SEM > VHC 0 ___ ___ ns tR(3) Operation Recovery Time tRC(2) ___ ___ ns 2740 tbl 10 |
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