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ISL71590SEHF Datasheet(PDF) 8 Page - Intersil Corporation |
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ISL71590SEHF Datasheet(HTML) 8 Page - Intersil Corporation |
8 / 16 page ISL71590SEH 8 June 3, 2016 FN8376.2 Submit Document Feedback support circuitry necessary with other thermal sensors such as thermistors, thermocouples and other discrete based solutions. External linearization circuitry, precision voltage amplifiers, resistance measuring circuitry and cold junction compensation are not needed when applying the ISL71590SEH. In the simplest application, the ISL71590SEH, a resistor, a power source and any voltmeter can be used to measure temperature. Ideally resistors used should be of a metal film or metal strip type, such resistors having very low thermal coefficient values. When voltage is initially applied to the ISL71590SEH, the circuit becomes active at slightly less than 4V, (V+ to V-), with IOUT ramping up typically 2µs after. There will be an initial short period of time for the IOUT to be correctly proportional to the ambient temperature. Depending on the VS ramp rate and amplitude this may take a few µs before a reliable temperature reading is available. See Figures 15 through 18 for scope shot examples. The output characteristics also makes the ISL71590SEH easy to multiplex; with either or both the input supply voltage or the output current can be switched by a CMOS multiplexer such as the HS-508 or HS-1840 from Intersil. When the ISL71590SEH die product is used, the die substrate should be tied to the more negative of the 2 terminals for optimum performance. Parameter Glossary The ISL71590SEH parametric specifications provide for an understanding of the temperature sensor performance over-temperature and radiation exposure. Following are critical parameter explanations as they relate to usage and interpretation. Ambient Error Accuracy refers to the maximum error at an ambient temperature of +25°C and is expressed as 0.5°C of the Nominal Current Output at +25°C (298.15K) of 298.15µA. The Absolute Error without External Calibration describes the temperature accuracy over the entire -55°C to +125°C range. The typical performance is shown in Figure 8 on page 5. Both of these two first specification explanations are to be considered as initial error accuracy specifications. The Post Low Dose Rate Radiation Ambient Error (ERADD) is the specified accuracy after 50krad(Si) at 0.01 rad(Si) per second (LDR) and 300krad(Si) at 70 rad(Si) per second (HDR) exposure. This radiation hardness performance is unmatched in the industry for this class of device, this performance is shown in Figure 2 on page 1 as a delta over radiation type and in Figure 19 on page 7 as an absolute measurement. Non-Linearity in referring to the ISL71590SEH, is the maximum allowable deviation of the output current over-temperature for any single part relative to its individual best fit line over 5 discrete temperature (-55°C, -15°C, +25°C, +85°C, +125°C) points. This performance is guaranteed by testing. Repeatability Errors arise from a strain hysteresis of the package. For the ISL71590SEH this is the maximum deviation between +25°C readings after a single temperature excursion between -55°C and +125°C, and is guaranteed by characterization and is not tested. The magnitude of this error is solely a function of the magnitude of the temperature span and duration over which the device is exposed. Long Term Drift Errors are related to the average operating temperature and the magnitude of the thermal shocks experienced by the device. Extended use of the ISL71590SEH temperatures at +125°C typically results in long-term drift of 0.05°C after 1khr with a specification of - 0.25°C to +0.25°C. Trimming Out Errors The ideal graph of current versus temperature for the ISL71590SEH is a straight line, but as Figure 20 on page 9 shows, the actual shape is slightly different (exaggerated greatly for explanation). Since the sensor is limited to the range of -55°C to +150°C it is possible to optimize the accuracy by trimming. Trimming extracts the maximum performance from the sensor. The circuit in Figure 21 on page 9 trims the slope of the ISL71590SEH output. The effect of this is shown in Figure 22 on page 9. The circuit of Figure 23 on page 9 trims both the slope and the offset. Starting in Figure 24 on page 9 with an untrimmed slope, then progressing through to Figure 27 on page 10 each figure showing the effect of adjusting the offset and slope and finally the offset again to finally arrive at an optimized condition. The diagrams curvatures are highly are exaggerated to show effects, but it should be clear that these trims can be used to minimize errors over a partial or the entire temperature range. |
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