SA57000-29D datasheet(4/8 Pages) PHILIPS

Part #	SA57000-29D

Description	CapFREEE 150 mA, low-noise, low dropout regulator with thermal protection

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Manufacturer	PHILIPS [NXP Semiconductors]

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Philips Semiconductors

Product data

SA57000-XX

CapFREE

™ 150 mA, low-noise, low dropout regulator

with thermal protection

2001 Aug 27

4

CHARACTERISTICS

VIN = VOUT(nom) + 0.5 V. (Note 1.)

SYMBOL

PARAMETER

CONDITIONS

MIN.

TYP.

MAX.

UNIT

VIN

input voltage

VOUT(nom)

–

5.5

V

output voltage accuracy 2

IOUT = 1 mA

Tamb = +25 °C

–

±1

–

%

–40

°C ≤ Tamb ≤ +85 °C

–2.0

–

2.0

%

ILIM

current limit

160

300

–

mA

IQ

ground pin current

IOUT = 1 mA to 150 mA

–

85

150

µA

dropout voltage 3

IOUT = 1 mA

–

1

–

mV

IOUT = 50 mA

–

55

120

mV

IOUT = 150 mA

–

165

–

mV

∆VLNR

line regulation

VIN = (VOUT + 0.1 V) to 5.5 V; IOUT = 20 mA

–

0.1

%/V

∆VLDR

load regulation

IOUT = 1 mA to 150 mA

–

0.01

0.02

%/mA

en

output voltage noise

f = 10 Hz to 100 kHz, COUT = 10 µF

–

30

–

µVRMS

Shutdown

VIH

PWRON input threshold

(HIGH ON-state)

VIN → VOUT(nom) → 5.5 V

0.7

× VIN

–

V

VIL

PWRON input threshold

(HIGH ON-state)

VIN → VOUT(nom) → 5.5 V

–

0.3

× VIN

V

IPWRON

PWRON input bias current

VPWRON = VIN

Tamb = +25 °C

–

0.01

1

µA

Tamb = +85 °C

–

0.05

–

µA

IQ(SHDN)

shutdown supply current

VOUT = 0 V

Tamb = +25 °C

–

0.05

1

µA

Tamb = +85 °C

–

0.2

1

µA

tPWRON

power-on start-up time 4

IOUT = 1 mA, COUT = 100 nF

Tamb = +25 °C

–

25

100

µs

Tamb = –40 to +85 °C

–

35

200

µs

Thermal protection (Note 2)

TSHDN

thermal shut-down temperature

–

144

–

°C

∆TSHDN

thermal shut-down hysteresis

–

13

–

°C

PWROK output (power and temperature OK) (Note 2)

PWROK trip temperature

–

127

–

°C

PWROK trip temperature

hysteresis

–

12

–

°C

PWROK trip as percentage of

VOUT(nom)

–3.5

–6

–8

%

PWROK hysteresis as

percentage of VOUT(nom)

–

2

–

%

PWROK output (when tripped)

ISINK = 0.5 mA

–

0.1

0.4

V

NOTES:

1. Limits are production tested at Tamb = +25 °C. All devices are 100% production tested at 25 °C. Limits over the operating tempreature are

guaranteed by design.

2. Accuracy

±2 °C over temperature range guaranteed by design and characterization.

3. The dropout voltage is defined as VIN – VOUT, where VOUT is 100 mV below the value of VOUT for VIN = VOUT + 0.5 V..

4. Time needed for VOUT to reach 95% of VOUT(nom).

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