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MIC5010BM Datasheet(PDF) 3 Page - Micrel Semiconductor |
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MIC5010BM Datasheet(HTML) 3 Page - Micrel Semiconductor |
3 / 16 page April 1998 5-89 MIC5010 Micrel 5 Electrical Characteristics (Note 3) Test circuit. T A = –55°C to +125°C, V + = 15V, V 1 = 0 V, I4 = I 5 = I14 = 0, all switches open, unless otherwise specified. Parameter Conditions Min Typical Max Units Supply Current, I 13 V+ = 32V V IN = 0V, S4 closed 0.1 10 µA V IN = VS = 32V, I4 = 200µA8 20 mA Logic Input Voltage, V IN V+ = 4.75V Adjust V IN for VGATE low 2 V Adjust V IN for VGATE high 4.5 V V+ = 15V Adjust V IN for VGATE high 5.0 V Logic Input Current, I 3 V+ = 32V V IN = 0V –1 µA V IN = 32V 1 µA Input Capacitance Pin 3 5 pF Gate Drive, V GATE S1, S2 closed, V+ = 7V, I 8 = 0 13 15 V V S = V+, VIN = 5V V+ = 15V, I 8 = 100 µA24 27 V Zener Clamp, S2 closed, V IN = 5V V+ = 15V, V S = 15V 11 12.5 15 V V GATE – VSOURCE V+ = 32V, V S = 32V 11 13 16 V Gate Turn-on Time, t ON V IN switched from 0 to 5V; measure time 25 50 µs (Note 4) for V GATE to reach 20V Gate Turn-off Time, t OFF V IN switched from 5 to 0V; measure time 4 10 µs for V GATE to reach 1V Threshold Bias Voltage, V 4 I 4 = 200 µA 1.7 2 2.2 V Current Sense Trip Voltage, S2 closed, V IN = 5V, V+ = 7V, S4 closed 75 105 135 mV V SENSE – VSOURCE Increase I 5 I 4 = 100 µAVS = 4.9V 70 100 130 mV V+ = 15V S4 closed 150 210 270 mV I 4 = 200 µAVS = 11.8V 140 200 260 mV V+ = 32V V S = 0V 360 520 680 mV I 4 = 500 µAVS = 25.5V 350 500 650 mV Peak Current Trip Voltage, S3, S4 closed, 1.6 2.1 V V SENSE – VSOURCE V+ = 15V, V IN = 5V Fault Output Voltage, V 14 V IN = 0V, I14 = –100 µA 0.4 1 V V IN = 5V, I14 = 100 µA, current sense tripped 14 14.6 V Current Sense Inhibit, V 1 V 1 above which current sense is disabled 7.5 13 V Minimum possible V 1 1V Note 1 Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Electrical specifications do not apply when operating the device beyond its specified Operating Ratings. Note 2 The MIC5010 is ESD sensitive. Note 3 Minimum and maximum Electrical Characteristics are 100% tested at T A = 25°C and TA = 85°C, and 100% guaranteed over the entire range. Typicals are characterized at 25 °C and represent the most likely parametric norm. Note 4 Test conditions reflect worst case high-side driver performance. Low-side and bootstrapped topologies are significantly faster—see Applications Information. |
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