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UT8CR512K32-17VCC Datasheet(PDF) 6 Page - Aeroflex Circuit Technology

Part # UT8CR512K32-17VCC
Description  UT8CR512K32 16 Megabit SRAM
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Manufacturer  AEROFLEX [Aeroflex Circuit Technology]
Direct Link  http://www.aeroflex.com
Logo AEROFLEX - Aeroflex Circuit Technology

UT8CR512K32-17VCC Datasheet(HTML) 6 Page - Aeroflex Circuit Technology

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6
AC CHARACTERISTICS READ CYCLE (Pre and Post-Radiation)*
(-55
°C to +125°C for (C) screening and -40°C to +125°C for (W) screening, V
DD1 = VDD1 (min), VDD2 = VDD2 (min))
Notes:
* Post-radiation performance guaranteed at 25
°C per MIL-STD-883 Method 1019.
1. Guaranteed, but not tested.
2. Three-state is defined as a 200mV change from steady-state output voltage.
3. The ET (enable true) notation refers to the latter falling edge of EN. SEU immunity does not affect the read parameters.
4. The EF (enable false) notation refers to the latter rising edge of EN. SEU immunity does not affect the read parameters.
SYMBOL
PARAMETER
8CR512-155
MIN
MAX
UNIT
tAVAV
1
Read cycle time
17
ns
tAVQV
Read access time
17
ns
tAXQX
2
Output hold time
3
ns
tGLQX
1,2
G-controlled output enable time
0
ns
tGLQV
G-controlled output enable time
7
ns
tGHQZ
2
G-controlled output three-state time
7
ns
tETQX
2,3
E-controlled output enable time
5
ns
tETQV
3
E-controlled access time
17
ns
tEFQZ
4
E-controlled output three-state time2
7ns


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