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CBR02C330G1GAC Datasheet(PDF) 11 Page - Kemet Corporation |
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CBR02C330G1GAC Datasheet(HTML) 11 Page - Kemet Corporation |
11 / 18 page © KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 • 864-963-6300 • www.kemet.com C1030_C0G_CBR • 8/1/2016 11 Surface Mount Multilayer Ceramic Capacitors (SMD MLCCs) for High Power Applications HiQ-CBR Series, C0G Dielectric, Low ESR 6.3 – 500 VDC, 1 MHz – 50 GHz (RF & Microwave) Table 4 – Performance & Reliability: Test Methods & Conditions Stress Test or Inspection Method Requirements Terminal Strength Pressurizing force: 0201 case size: 2N 0402 & 0603 case sizes: 5N 0805 case size: 10N Test time: 10±1 second No visible damage or separation of termination system. Vibration Resistance Vibration frequency: 10 ~ 55 Hz/minimum Total amplitude: 1.5 mm Test time: 6 hours (Two hours each in three mutually perpendicular directions.) No visible damage. CapchangeandQ/DF:Tomeetinitialspecification Solderability Soldertemperature:235±5°C Dipping time: 2±0.5 seconds 95%minimumcoverageofterminationfinish. Board Flex Capacitorismountedtoasubstratewhichisflexedby means of ram at a rate of 1 mm per second until the deflectionbecomes1mm.(Deflectionismaintained for 5±1 second) Store at room temperature for 24±2 hours before measuring electrical properties. No visible damage. Capacitance change: within ±5.0% or ±0.5 pF, whichever is larger. (Capacitancechangeismonitoredduringflexure.) Resistance to Soldering Heat Soldertemperature:260±5°C Dipping time: 10±1 second Preheating:120to150°Cfor1minutebeforeimmerse the capacitor in a eutectic solder. Store at room temperature for 24±2 hours before measuring electrical properties. No visible damage. Capacitance change: within ±2.5% or ±0.25 pF, whichever is larger. Q/DF, IR and dielectric strength: To meet initial requirements. 25% maximum leaching on each edge. Temperature Cycling 5 cycles of steps 1 - 4: No visible damage. Capacitance change: within ±2.5% or ±0.25 pF, whichever is larger. Q/DF, IR and dielectric strength: To meet initial requirements. Step Temperature (ºC) Time (min.) 1 Minimum operating temperature+0/−3 30 ±3 2 Room temperature 2 ~ 3 3 Maximum operating temperature+3/−0 30 ±3 4 Room temperature (25ºC) 2 ~ 3 Store at room temperature for 24±2 hours before measuring electrical properties. |
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