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NE5517 Datasheet(PDF) 8 Page - NXP Semiconductors |
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NE5517 Datasheet(HTML) 8 Page - NXP Semiconductors |
8 / 18 page Philips Semiconductor Product data NE5517/NE5517A/ AU5517 Dual operational transconductance amplifier 2002 Dec 06 8 TYPICAL PERFORMANCE CHARACTERISTICS (Continued) Leakage Current Test Circuit Differential Input Current Test Circuit Buffer VBE Test Circuit 4, 13 2, 15 3, 14 – + NE5517 11 6 1, 15 5, 12 7, 10 8, 9 A +36V 4, 13 2, 15 3, 14 – + NE5517 11 6 1, 10 5, 12 A +15V –15V 4V V V+ 50k Ω V– SL00311 Figure 6. Typical Performance Characteristics (cont.) APPLICATIONS 4, 13 2, 15 3, 14 – + NE5517 11 6 5, 12 1, 16 +15V –15V 7, 10 8, 9 INPUT OUTPUT 5k 390pF 10k 1.3k 10k 62k –15V 51 Ω 0.01 µF 0.001 µF 0.01 µF Unity Gain Follower SL00312 Figure 7. Applications |
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