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DP7310 Datasheet(PDF) 3 Page - National Semiconductor (TI) |
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DP7310 Datasheet(HTML) 3 Page - National Semiconductor (TI) |
3 / 10 page AC Electrical Characteristics DP7310DP8310 VCC e 45V TA eb55 Cto a125 C Symbol Parameter Conditions Min Typ Max Units tpd0 High to Low Propagation Delay (Figure 1) 40 120 ns Write Enable Input to Output tpd1 Low to High Propagation Delay (Figure 1) 70 150 ns Write Enable Input to Output tSETUP Minimum Set-Up Time tHOLD e 0ns 45 20 ns Data in to Write Enable Input (Figure 1) tpWH Minimum Write Enable Pulse (Figure 1) 60 25 ns tpWL Width tTHL High to Low Output Transition Time (Figure 1) 16 35 ns tTLH Low to High Output Transition Time (Figure 1) 38 70 ns CIN ‘‘N’’ Package (Note 4) 5 15 pF AC Electrical Characteristics DP7311DP8311 VCC e 5V TA e 25 C Symbol Parameter Conditions Min Typ Max Units tpd0 High to Low Propagation Delay (Figure 2) 30 60 ns Data In to Output tpd1 Low to High Propagation Delay (Figure 2) 70 100 ns Data to Output tSETUP Minimum Set-Up Time tHOLD e 0ns 0 b 25 ns Data in to Strobe Input (Figure 2) tpWL Minimum Strobe Enable Pulse Width (Figure 2) 60 35 ns tpdC Propagation Delay Clear to Data Output (Figure 2) 70 135 ns tpWC Minimum Clear Input Pulse Width (Figure 2) 60 25 ns tTHL High to Low Output Transition Time (Figure 2) 20 35 ns tTLH Low to High Output Transition Time (Figure 2) 38 60 ns CIN Input CapacitanceAny Input (Note 4) 5 15 pF Note 1 ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed Except for ‘‘Operating Temperature Range’’ they are not meant to imply that the devices should be operated at these limits The table of ‘‘Electrical Characteristics’’ provides conditions for actual device operation Note 2 Unless otherwise specified minmax limits apply across the b55 Cto a125 C temperature range for the DP7310DP7311 and across the 0 Cto a70 C for the DP8310DP8311 All typical values are for TA e25 C VCC e 5V Note 3 All currents into device pins shown as positive out of device pins as negative all voltages referenced to ground unless otherwise noted Note 4 Input capacitance is guaranteed by periodic testing fTEST e 10 kHz at 300 mV TA e 25 C 3 |
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