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ACS770LCB-050B-PFF-T Datasheet(PDF) 7 Page - Allegro MicroSystems

Part # ACS770LCB-050B-PFF-T
Description  4.1 關s output rise time in response to step input current
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Manufacturer  ALLEGRO [Allegro MicroSystems]
Direct Link  http://www.allegromicro.com
Logo ALLEGRO - Allegro MicroSystems

ACS770LCB-050B-PFF-T Datasheet(HTML) 7 Page - Allegro MicroSystems

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Thermally Enhanced, Fully Integrated, Hall-Effect-Based
High-Precision Linear Current Sensor IC with 100 µΩ Current Conductor
ACS770xCB
7
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
X050U PERFORMANCE CHARACTERISTICS [1]: TOP = –40°C to 150°C, CBYP = 0.1 μF, VCC= 5 V, unless otherwise specified
Characteristic
Symbol
Test Conditions
Min.
Typ.
Max.
Unit
Primary Sampled Current
IP
0
50
A
Sensitivity [2]
SensTA
Measured using full-scale IP, TA = 25°C
78.08
80
81.92
mV/A
Sens(TOP)HT Measured using full-scale IP, TOP = 25°C to 150°C
78.08
80
81.92
mV/A
Sens(TOP)LT Measured using full-scale IP, TOP = –40°C to 25°C
77.2
80
82.8
mV/A
Sensitivity Drift Over Lifetime [3] ΔSensLIFE
TOP = –40°C to 150°C, shift after AEC-Q100 grade 0
qualification testing
–1.44
±0.48
1.44
mV/A
Noise [4]
VNOISE
TA= 25°C, 10 nF on VIOUT pin to GND
20
mV
Nonlinearity
ELIN
Measured using full-scale and half-scale IP
–1
1
%
Electrical Offset Voltage [5][6]
VOE(TA)
IP = 0 A, TA = 25°C
–10
±4
10
mV
VOE(TOP)HT IP = 0 A, TOP = 25°C to 150°C
–10
±6
10
mV
VOE(TOP)LT IP = 0 A, TOP = –40°C to 25°C
–20
±6
20
mV
Electrical Offset Voltage Drift
Over Lifetime [3]
∆VOE(LIFE)
IP = 0 A, TOP = –40°C to 150°C, shift after AEC-Q100 grade 0
qualification testing
–5
±2
5
mV
Magnetic Offset Error
IERROM
IP = 0 A, TA = 25°C, after excursion of 50 A
120
300
mA
Total Output Error [7]
ETOT(TA)
Measured using full-scale IP, TA = 25°C
–2.4
±0.5
2.4
%
ETOT(HT)
Measured using full-scale IP, TOP = 25°C to 150°C
–2.4
±1.5
2.4
%
ETOT(LT)
Measured using full-scale IP, TOP = –40°C to 25°C
–3.5
±2
3.5
%
Total Output Error Drift Over
Lifetime [3]
ΔETOT(LIFE)
TOP = –40°C to 150°C, shift after AEC-Q100 grade 0
qualification testing
–1.9
±0.6
1.9
%
1
See Characteristic Performance Data page for parameter distributions over temperature range.
2
This parameter may drift a maximum of ΔSensLIFE over lifetime.
3
Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot be guaranteed. Drift
is a function of customer application conditions. Contact Allegro MicroSystems for further information.
4
±3 sigma noise voltage.
5
Drift is referred to ideal VIOUT(QBI) = 0.5 V.
6
This parameter may drift a maximum of ΔVOE(LIFE) over lifetime.
7
This parameter may drift a maximum of ΔETOT(LIFE) over lifetime.


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