Rev. 1.2 Jan. 2005

256MB,512MB,1GB Unbuffered DIMMs

DDR2 SDRAM

Absolute Maximum DC Ratings

AC & DC Operating Conditions

Recommended DC Operating Conditions (SSTL - 1.8)

Symbol

Parameter

Rating

Units

Notes

VDD

Voltage on VDD pin relative to Vss

- 1.0 V ~ 2.3 V

V

1

VDDQ

Voltage on VDDQ pin relative to Vss

- 0.5 V ~ 2.3 V

V

1

VDDL

Voltage on VDDL pin relative to Vss

- 0.5 V ~ 2.3 V

V

1

V

IN

Voltage on any pin relative to Vss

- 0.5 V ~ 2.3 V

V

1

T

STG

Storage Temperature

-55 to +100

°C

1, 2

1.

Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a

stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational

sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reli-

ability.

2. Storage Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement conditions, please

refer to JESD51-2 standard.

Symbol

Parameter

Rating

Units

Notes

Min.

Typ.

Max.

VDD

Supply Voltage

1.7

1.8

1.9

V

VDDL

Supply Voltage for DLL

1.7

1.8

1.9

V

4

VDDQ

Supply Voltage for Output

1.7

1.8

1.9

V

4

VREF

Input Reference Voltage

0.49*VDDQ

0.50*VDDQ

0.51*VDDQ

mV

1,2

VTT

Termination Voltage

V

3

There is no specific device VDD supply voltage requirement for SSTL-1.8 compliance. However under all conditions VDDQ must

be less than or equal to VDD.

1. The value of VREF may be selected by the user to provide optimum noise margin in the system. Typically the value of VREF is

expected to be about 0.5 x VDDQ of the transmitting device and VREF is expected to track variations in VDDQ.

2. Peak to peak AC noise on VREF may not exceed +/-2% VREF(DC).

3. VTT of transmitting device must track VREF of receiving device.

4. AC parameters are measured with VDD, VDDQ and VDDDL tied together.