WM8786

Rev 4.4

7

Test Conditions

1kHz signal, A-weighted, fs = 48kHz, MCLK = 256fs, 24-bit audio data, Slave Mode unless otherwise stated.

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply Current

Analogue supply current

27

mA

Digital supply current

5

mA

Power Down

22

uA

Note:

1.

The VMID and VREF pins should be decoupled with a 10µF electrolytic capacitor (ESR < 1.5

Ω across all operating

temperatures) and a 0.1µF ceramic capacitor. Device operation with other decoupling is not recommended, and may affect

performance.

TERMINOLOGY

1.

Signal-to-noise ratio (dB)

– Ratio of output level with 1kHz full scale input, to the output level with all zeros into the digital

input, over a 20Hz to 20kHz bandwidth. (No Auto-zero or Automute function is employed in achieving these results).

2.

Dynamic range (dB) - DR is a measure of the difference between the highest and lowest portions of a signal. Normally a

THD+N measurement at 60dB below full scale. The measured signal is then corrected by adding the 60dB to it. (e.g. THD+N

@ -60dB= -32dB, DR= 92dB).

3.

THD+N (dB) - THD+N is a ratio, of the rms values, of (Noise + Distortion)/Signal.

4.

Channel Separation (dB) - Also known as Cross-Talk. This is a measure of the amount one channel is isolated from the

other. Normally measured by sending a full scale signal down one channel and measuring the other.

5.

All performance measurements are done with a 20kHz low pass filter, and where noted an A-weight filter, except where noted.

Failure to use such a filter will result in higher THD+N and lower SNR and Dynamic Range readings than are found in the

Electrical Characteristics. The low pass filter removes out of band noise; although this is not audible, it may affect dynamic

specification values.