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NCN49597MNG Datasheet(PDF) 7 Page - ON Semiconductor |
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NCN49597MNG Datasheet(HTML) 7 Page - ON Semiconductor |
7 / 30 page NCN49597 www.onsemi.com 7 Table 5. ELECTRICAL CHARACTERISTICS All parameters are valid for TJ = −40°C to 125°C, VDD = 3.3 V, fCLK = 48 MHz ± 50 ppm unless otherwise specified. Parameter Test Conditions Symbol Min Typ Max Unit INTERNAL VOLTAGE REGULATOR: PIN VDD1V8 (power supply and voltage reference) VDD and VDDA current consumption VDD18 1.62 1.80 1.98 V During reception (Note 10) IRX 40 60 mA During transmission (Note 10) ITX 40 60 mA RESB = 0 IRESET 4 mA OSCILLATOR: PIN XIN, XOUT (Note 11) Duty cycle with quartz connected 35 65 % Start−up time Tstartup 15 ms Load capacitance external crystal CL 18 pF Series resistance external crystal RS 1 6 60 W Maximum Capacitive load on XOUT XIN used as clock input CLXOUT 15 pF Low input threshold voltage XIN used as clock input VILXOUT 0.3 VDD18 V High input threshold voltage XIN used as clock input VIHXOUT 0.7 VDD18 V Low output voltage XIN used as clock input, XOUT = 2 mA VOLXOUT 0.3 V High input voltage XIN used as clock input VOHXOUT VDD18 − 0.3 V Rise and fall time on XIN XIN used as clock input trXIN_EXT 1.5 ns ZERO CROSSING DETECTOR AND 50/60 HZ PLL: PIN ZC_IN Mains voltage input range With protection resistor at ZC_IN (Note 12) VMAINS 90 550 VPK Rising threshold level VIRZC_IN 1.9 V Falling threshold level VIFZC_IN 0.85 V Hysteresis VHYZC_IN 0.4 V Lock range (Note 13) R_CONF[0] = 0 (50 Hz) Flock50Hz 45 55 Hz R_CONF[0] = 1 (60 Hz) Flock60Hz 54 66 Hz Lock time (Note 13) R_CONF[0] = 0 (50 Hz) Tlock50Hz 15 s R_CONF[0] = 1 (60 Hz) Tlock60Hz 20 s Frequency variation without going out of lock (Note 13) R_CONF[0] = 0 (50 Hz) DF60Hz 0.1 Hz/s Frequency variation without going out of lock (Note 13) R_CONF[0] = 1 (60 Hz) DF50Hz 0.1 Hz/s Jitter of CHIP_CLK (Note 13) JitterCHIP_CLK 25 ms 10. With typical firmware. The exact value depends on the firmware variant loaded and the firmware configuration. 11. In production the actual oscillation of the oscillator and duty cycle will not be tested. The production test will be based on the static parame- ters and the inversion from XIN to XOUT in order to guarantee the functionality of the oscillator. 12. This parameter is not tested in production. 13. These parameters will not be measured in production as the performance is determined by a digital circuit. Correct operation of this circuit will be guaranteed by the digital test patterns. |
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