NCN49597

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7

Table 5. ELECTRICAL CHARACTERISTICS

Parameter

Test Conditions

Symbol

Min

Typ

Max

Unit

INTERNAL VOLTAGE REGULATOR: PIN VDD1V8 (power supply and voltage reference)

1.62

1.80

1.98

V

During reception (Note 10)

40

60

mA

During transmission (Note 10)

40

60

mA

RESB = 0

4

mA

OSCILLATOR: PIN XIN, XOUT (Note 11)

Duty cycle with quartz connected

35

65

%

Start−up time

15

ms

Load capacitance external crystal

18

pF

Series resistance external crystal

1

6

60

W

Maximum Capacitive load on XOUT

XIN used as clock input

15

pF

Low input threshold voltage

XIN used as clock input

0.3

V

High input threshold voltage

XIN used as clock input

0.7

V

Low output voltage

XIN used as clock input,

XOUT = 2 mA

0.3

V

High input voltage

XIN used as clock input

0.3

V

Rise and fall time on XIN

XIN used as clock input

1.5

ns

ZERO CROSSING DETECTOR AND 50/60 HZ PLL: PIN ZC_IN

Mains voltage input range

With protection resistor at ZC_IN

(Note 12)

90

550

Rising threshold level

1.9

V

Falling threshold level

0.85

V

Hysteresis

0.4

V

Lock range (Note 13)

R_CONF[0] = 0 (50 Hz)

45

55

Hz

R_CONF[0] = 1 (60 Hz)

54

66

Hz

Lock time (Note 13)

R_CONF[0] = 0 (50 Hz)

15

s

R_CONF[0] = 1 (60 Hz)

20

s

Frequency variation without going out of

lock (Note 13)

R_CONF[0] = 0 (50 Hz)

0.1

Hz/s

Frequency variation without going out of

lock (Note 13)

R_CONF[0] = 1 (60 Hz)

0.1

Hz/s

Jitter of CHIP_CLK (Note 13)

25

ms

10. With typical firmware. The exact value depends on the firmware variant loaded and the firmware configuration.

11. In production the actual oscillation of the oscillator and duty cycle will not be tested. The production test will be based on the static parame-

ters and the inversion from XIN to XOUT in order to guarantee the functionality of the oscillator.

12. This parameter is not tested in production.

13. These parameters will not be measured in production as the performance is determined by a digital circuit. Correct operation of this circuit

will be guaranteed by the digital test patterns.