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TH7899M Datasheet(PDF) 6 Page - ATMEL Corporation |
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TH7899M Datasheet(HTML) 6 Page - ATMEL Corporation |
6 / 24 page 6 TH7899M 2201A–IMAGE–02/02 Output Amplifiers The TH7899M sensor has four output amplifiers. These are located in each corner of the device at the ends of the readout register. Charge packets are clocked to a pre- charge capacitor (floating diffusion) whose potential varies linearly with the quantity of charge in each packet. This potential is applied to the input gate of a two stage source follower amplifier and the output signal is read. Then, the reset clock ΦR removes the charge from the floating diffusion via the reset drain VDR which imposes its reference level. Figure 5. On-chip Output Amplifier Structure Multi-Pinned-Phase (MPP) Mode The TH7899M sensor operates in the MPP mode in order to substantially decrease dark current (typically from 0.6 nA/cm2 to 25 pA/cm2 at 25°C). Compared to standard technol- ogy, the MPP mode allows, while keeping all other performances unchanged, either to increase exposure time, or to operate at higher temperature. Dark current is due to thermal generation in the substrate of the CCD. The different gen- eration sources are as follows: • surface states at the Si-SiO 2 interface which is the main contribution • generation and diffusion in the bulk • generation in the depleted zone If the gates are biased with adequate negative biases, holes appear at the Si-SiO 2 inter- face and fill in the interface states suppressing their dark current contribution. As a result, only the minor bulk and depleted zone contributions remain. Absolute Maximum Ratings* Storage temperature..................................... -55°C to + 150°C Operating temperature ................................... -40°C to + 85°C Temperature cycling ...................................................15°C/mn *NOTICE: Stresses above those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent device failure. Functionally at or above these lim- its is not implied. Exposure to absolute maximum ratings for extended periods may affect reliability. |
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