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PH2625L Datasheet(PDF) 2 Page - NXP Semiconductors |
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PH2625L Datasheet(HTML) 2 Page - NXP Semiconductors |
2 / 13 page 9397 750 14324 © Koninklijke Philips Electronics N.V. 2005. All rights reserved. Preliminary data sheet Rev. 02 — 24 February 2005 2 of 13 Philips Semiconductors PH2625L N-channel TrenchMOS™ logic level FET 3. Ordering information 4. Limiting values [1] Duty cycle is limited by the maximum junction temperature. [2] Repetitive avalanche failure is not determined simply by thermal effects. Repetitive avalanche transients should only be applied for short bursts, not every switching cycle. Table 2: Ordering information Type number Package Name Description Version PH2625L LFPAK plastic single-ended surface mounted package; 4 leads SOT669 Table 3: Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions Min Max Unit VDS drain-source voltage (DC) 25 °C ≤ T j ≤ 150 °C - 25 V VDGR drain-gate voltage (DC) 25 °C ≤ T j ≤ 150 °C; RGS =20kΩ -25 V VGS gate-source voltage - ±20 V ID drain current (DC) Tmb =25 °C; VGS =10V; Figure 2 and 3 - 100 A Tmb = 100 °C; VGS =10V; Figure 2 -63 A IDM peak drain current Tmb =25 °C; pulsed; tp ≤ 10 µs; Figure 3 - 300 A Ptot total power dissipation Tmb =25 °C; Figure 1 - 62.5 W Tstg storage temperature −55 +150 °C Tj junction temperature −55 +150 °C Source-drain diode IS source (diode forward) current (DC) Tmb =25 °C - 52 A ISM peak source (diode forward) current Tmb =25 °C; pulsed; tp ≤ 10 µs - 156 A Avalanche ruggedness EDS(AL)S non-repetitive drain-source avalanche energy unclamped inductive load; ID =71A; tp = 0.1 ms; VDD ≤ 25 V; RGS =50 Ω; VGS = 10 V; starting at Tj =25 °C - 250 mJ EDS(AL)R repetitive drain-source avalanche energy unclamped inductive load; ID = 7.1 A; tp = 0.01 ms; VDD ≤ 25 V; RGS =50 Ω; VGS =10V [1] [2] - 2.5 mJ |
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