CY7C225A
Document #: 38-04001 Rev. *B
Page 2 of 9
Maximum Ratings[1]
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature
..................................... −65°C to +150°C
Ambient Temperature with
Power Applied
.................................................. −55°C to +125°C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12)
.................................................−0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State
.....................................................−0.5V to +7.0V
DC Input Voltage
.................................................−3.0V to +7.0V
DC Program Voltage (Pins 7, 18, 20) ........................... 13.0V
Static Discharge Voltage............................................ >2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current ..................................................... >200 mA
Operating Range
Range
Ambient
Temperature
VCC
Commercial
0
°C to +70°C
5V ± 10%
Military[2]
−55
°C to +125°C
5V ± 10%
Electrical Characteristics Over the Operating Range[3,4]
Parameter
Description
Test Conditions
Min.
Max.
Unit
VOH
Output HIGH Voltage
VCC = Min., IOH = −4.0 mA
VIN = VIH or VIL
2.4
V
VOL
Output LOW Voltage
VCC = Min., IOL = 16 mA
VIN = VIH or VIL
0.4
V
VIH
Input HIGH Level
Guaranteed Input Logical HIGH Voltage for
All Inputs
2.0
V
VIL
Input LOW Level
Guaranteed Input Logical LOW Voltage for All
Inputs
0.8
V
IIX
Input Leakage Current
GND < VIN < VCC
−10
+10
µA
VCD
Input Clamp Diode Voltage
Note 4
IOZ
Output Leakage Current
GND < VOUT < VCC, Output Disabled
[5]
−10
+10
µA
IOS
Output Short Circuit Current
VCC = Max., VOUT = 0.0V
[6]
−20
−90
mA
ICC
Power Supply Current
IOUT = 0 mA
VCC = Max.
Commercial
90
mA
Military
120
VPP
Programming Supply Voltage
12
13
V
IPP
Programming Supply Current
50
mA
VIHP
Input HIGH Programming
Voltage
3.0
V
VILP
Input LOW Programming
Voltage
0.4
V
Capacitance[4]
Parameter
Description
Test Conditions
Max.
Unit
CIN
Input Capacitance
TA = 25°C, f = 1 MHz,
VCC =5.0V
10
pF
COUT
Output Capacitance
10
pF
Notes:
1.
The Voltage on any input or I/O pin cannot exceed the power pin during power-up.
2.
TA is the “instant on” case temperature.
3.
See the last page of this specification for Group A subgroup testing information.
4.
See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.
5.
For devices using the synchronous enable, the device must be clocked after applying these voltages to perform this measurement.
6.
For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
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