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Revision: 28-Sep-17

6

Document Number: 28390

THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT

Fig. 3 - Multiplier of useful life as a function of ambient temperature and ripple current load

Table 4

Table 5

Statements about product lifetime are based on calculations and internal testing. They should only be interpreted as estimations. Also due to external factors, the

lifetime in the field application may deviate from the calculated lifetime. In general, nothing stated herein shall be construed as a guarantee of durability.

FREQUENCY (Hz)

50

100

120

500

1000

≥ 10 000

0.80

1.00

1.05

1.30

1.40

1.50

TEST PROCEDURES AND REQUIREMENTS

TEST

PROCEDURE

(quick reference)

REQUIREMENTS

NAME OF TEST

REFERENCE

Endurance

IEC 60384-4 / EN 130300

subclause 4.13

2000 h

ΔC/C: ± 10 %

ESR

≤ 1.3 x spec. limit

Z

≤ 2 x spec. limit

≤ spec. limit

Useful life

CECC 30301 subclause 1.8.1

5000 h

ΔC/C: ± 30 %

ESR

≤ 3 x spec. limit

Z

≤ 3 x spec. limit

≤ spec. limit

no short or open circuit,

no visible damage

total failure percentage:

≤ 3 %

Shelf life

(storage at

high temperature)

IEC 60384-4 / EN 130300

subclause 4.17

1000 h

24 h to 48 h before measurement

ΔC/C: ± 10 %

ESR

≤ 1.2 x spec. limit

≤ 2 x spec. limit

2.6

2.4

2.2

2.0

1.8

1.6

1.4

1.2

1.0

0.8

0.5

0.0

40

50

60

70

80

90

100

(1)

I

A

I

R

Lifetime multiplier

CCC205-05

T

I

I