LMK60E0-212M50SIAR datasheet(6/19 Pages) TI1

Part #	LMK60E0-212M50SIAR

Description	High Performance Low Jitter Oscillator

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Manufacturer	TI1 [Texas Instruments]

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6

LMK60E2-125M, LMK60E2-156M, LMK60E0-156M

LMK60E0-212M, LMK60I2-100M, LMK60I2-322M

SNAS718B – DECEMBER 2016 – REVISED OCTOBER 2017

www.ti.com

Product Folder Links: LMK60E2-125M LMK60E2-156M LMK60E0-156M LMK60E0-212M LMK60I2-100M LMK60I2-

322M

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(1)

Ensured by characterization.

(2)

Ensured by design.

6.11 Power-On/Reset Characteristics (VDD)

VDD = 3.3 V ± 5%, TA = -40°C to 85°C

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VTHRESH

Threshold voltage(1)

2.85

3

V

VDROOP

Allowable voltage droop(2)

0.1

V

tSTARTUP

Start-up time (1)

Time elapsed from VDD at 3.135 V to output

enabled

10

ms

tOE-EN

Output enable time(2)

Time elapsed from OE at VIH to output enabled

50

µs

tOE-DIS

Output disable time(2)

Time elapsed from OE at VIL to output disabled

50

µs

(1)

Refer to Parameter Measurement Information for relevant test conditions.

(2)

Measured max spur level with 50 mVpp sinusoidal signal between 50 kHz and 1 MHz applied on VDD pin

(3)

DJSPUR (ps, pk-pk) = [2*10(SPUR/20) / (π*fOUT)]*1e6, where PSRR or SPUR in dBc and fOUT in MHz.

6.12 PSRR Characteristics

(1)

VDD = 3.3 V, TA = 25°C

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

PSRR

Spurs induced by 50-mV

power supply ripple(2)(3) at

156.25-MHz output, all

output types

Sine wave at 50 kHz

–60

dBc

Sine wave at 100 kHz

–60

Sine wave at 500 kHz

–60

Sine wave at 1 MHz

–60

(1)

Refer to Parameter Measurement Information for relevant test conditions.

(2)

Phase jitter measured with Agilent E5052 signal source analyzer using a differential-to-single ended converter (balun or buffer).

(3)

Ensured by characterization.

6.13 PLL Clock Output Jitter Characteristics

(1) (2)

VDD = 3.3 V ± 5%, TA = -40°C to 85°C

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

RJ

RMS phase jitter(3)

(12 kHz – 20 MHz)

fOUT ≥ 100 MHz, all output types

150

250

fs RMS

6.14 Additional Reliability and Qualification

PARAMETER

CONDITION / TEST METHOD

Mechanical Shock

MIL-STD-202, Method 213

Mechanical Vibration

MIL-STD-202, Method 204

Moisture Sensitivity Level

J-STD-020, MSL3

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LMK60E0-212M50SIAR Datasheet(PDF) 6 Page - Texas Instruments

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