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LMK60E2-150M, LMK60E0-156257

LMK60A0-148351, LMK60A0-148M

www.ti.com

SNAS687C – JUNE 2016 – REVISED NOVEMBER 2017

Product Folder Links: LMK60E2-150M LMK60E0-156257 LMK60A0-148351 LMK60A0-148M

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Copyright © 2016–2017, Texas Instruments Incorporated

(1)

(2)

Ensured by characterization.

6.7 LVDS Output Characteristics

(1)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

10

800

MHz

Output voltage swing

(1)

300

390

480

mV

Differential output peak-to-peak swing

V

Output common-mode voltage

1.2

V

150

250

ps

ODC

45%

55%

Differential output impedance

125

Ω

(1)

Refer to Parameter Measurement Information for relevant test conditions.

(2)

Measured from -150 mV to +150 mV on the differential waveform with the 300 mVpp measurement window centered on the differential

zero crossing.

(3)

Ensured by design.

(4)

Ensured by characterization.

6.8 HCSL Output Characteristics

(1)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Output frequency

10

400

MHz

Output high voltage

600

850

mV

Output low voltage

–100

100

mV

250

475

mV

(2) (3)

0

140

mV

dV/dt

0.8

2

V/ns

ODC

45%

55%

6.9 OE Input Characteristics

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Input high voltage

1.4

V

Input low voltage

0.6

V

Input high current

–40

40

µA

Input low current

–40

40

µA

Input capacitance

2

pF

(1)

Ensured by characterization.

6.10 Frequency Tolerance Characteristics

(1)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Total frequency tolerance

LMK60X2: All output formats, frequency

bands and device junction temperature up to

125°C; includes initial freq tolerance,

temperature & supply voltage variation, solder

reflow and aging (10 years)

–50

50

ppm

LMK60X0: All output formats, frequency

bands and device junction temperature up to

115°C; includes initial freq tolerance,

temperature & supply voltage variation, solder

reflow and aging (5 years at 40°C)

–25

25

ppm