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AN80P52RSP Datasheet(PDF) 10 Page - Panasonic Semiconductor |
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AN80P52RSP Datasheet(HTML) 10 Page - Panasonic Semiconductor |
10 / 28 page AN80PxxRSP Series 10 SFF00010CEB Parameter Symbol Conditions Min Typ Max Unit Output voltage VOUT VIN = 3.7 V, IOUT = 500 mA 2.619 2.7 2.781 V Line regulation REGIN VIN = 3.7 V → 14.0 V, IOUT = 250 mA 27 mV Load regulation REGLOA VIN = 3.7 V, IOUT = 0 mA → 1 000 mA 54 mV Peak output current IPEAK VIN = 3.7 V, The output current value 1 200 mA when VOUT decreases by 5% from its value at IOUT = 500 mA. Bias current under no load IBIAS VIN = 3.7 V, IOUT = 0 mA 1.1 3.0 mA Bias current fluctuation to input ∆I BIAS(IN) VIN = 3.7 V → 14.0 V, IOUT = 250 mA −5 5mA Bias current fluctuation to load ∆I BIAS(LOA) VIN = 3.7 V, IOUT = 0 mA → 1 000 mA 50 mA Standby consumption current ISTB VIN = 14.0 V, VCONT = 0 V 3.0 µA Bias current before starting regulation IRUSH VIN = 2.565 V, IOUT = 0 A 5mA Control terminal current ICONT VIN = 3.7 V, IOUT = 500 mA 30 µA VCONT = 1.8 V Ripple rejection ratio 1 RR1 VIN = 4.7 V ± 1 V[p-p] 55.3 dB f = 120 Hz, I OUT = 100 mA Minimum input/ VDIF(min)1 VIN = 2.8 V, IOUT = 500 mA 0.30 0.60 V output voltage difference 1 Minimum input/ VDIF(min)2 VIN = 2.9 V, IOUT = 1 000 mA 1.0 V output voltage difference 2 Control terminal threshold high voltage VCONTH VIN = 3.7 V 1.45 1.80 V Control terminal threshold low voltage VCONTL VIN = 3.7 V 0.50 0.70 V Parameter Symbol Conditions Min Typ Max Unit Ripple rejection ratio 2 RR2 VIN = 4.7 V ± 1 V[p-p], COUT = 33 +0.1 µF 30 dB f = 500 kHz, I OUT = 100 mA Output noise voltage VNO 10 Hz ≤ f ≤ 100 kHz, I OUT = 100 mA 40 µV[rms] CNR = 1 µF, V IN = 3.7 V Output voltage temperature dVOUT VIN = 3.7 V, IOUT = 5 mA ±40 ppm/°C coefficient dTa −30°C ≤ T a ≤ +125°C Output short-circuit current IOSHORT VIN = 14.0 V, VOUT = GND 2 000 mA Overheat protection operating TjTH VIN = 3.7 V, IOUT = 5 mA 150 °C temperature I Electrical Characteristics at Ta = 25°C (continued) • AN80P27RSP (2.7 V type) Unless otherwise specially provided, shorten each test time (within 10 ms) so that the test is conducted under the condition that the drift due to the temperature increase in the chip junction part can be neglected. CIN = 100 µF, CNR = Open, COUT = 0.1 µF • Design reference data Note) The following values are typical and not guaranteed values. |
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