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MBT3946DW1T1 Datasheet(PDF) 8 Page - ON Semiconductor |
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MBT3946DW1T1 Datasheet(HTML) 8 Page - ON Semiconductor |
8 / 12 page MBT3946DW1T1 http://onsemi.com 8 (PNP) Figure 19. Delay and Rise Time Equivalent Test Circuit Figure 20. Storage and Fall Time Equivalent Test Circuit 3 V 275 10 k 1N916 Cs < 4 pF* 3 V 275 10 k Cs < 4 pF* < 1 ns +0.5 V 10.6 V 300 ns DUTY CYCLE = 2% < 1 ns +9.1 V 10.9 V DUTY CYCLE = 2% t1 0 10 < t1 < 500 ms * Total shunt capacitance of test jig and connectors TYPICAL TRANSIENT CHARACTERISTICS Figure 21. Capacitance REVERSE BIAS (VOLTS) 2.0 3.0 5.0 7.0 10 1.0 0.1 Figure 22. Charge Data IC, COLLECTOR CURRENT (mA) 5000 1.0 VCC = 40 V IC/IB = 10 3000 2000 1000 500 300 200 700 100 50 70 2.0 3.0 5.0 7.0 10 20 30 50 70 100 200 1.0 2.0 3.0 5.0 7.0 10 20 30 40 0.2 0.3 0.5 0.7 QT QA Cibo Cobo TJ = 25°C TJ = 125°C (PNP) (PNP) Figure 23. Turn −On Time IC, COLLECTOR CURRENT (mA) 70 100 200 300 500 50 1.0 2.0 3.0 10 20 70 5 100 Figure 24. Fall Time IC, COLLECTOR CURRENT (mA) 5.0 7.0 30 50 200 10 30 7 20 70 100 200 300 500 50 1.0 2.0 3.0 10 20 70 5 100 5.0 7.0 30 50 200 10 30 7 20 VCC = 40 V IB1 = IB2 IC/IB = 20 IC/IB = 10 IC/IB = 10 tr @ VCC = 3.0 V td @ VOB = 0 V 40 V 15 V 2.0 V (PNP) (PNP) |
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