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DAC100 Datasheet(PDF) 4 Page - Analog Devices |
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DAC100 Datasheet(HTML) 4 Page - Analog Devices |
4 / 5 page DAC100 ASD0011162 Rev. F | Page 4 of 5 4.1 Electrical Test Requirements: 1/ PDA applies to subgroup 1. Deltas not included in PDA 2/ See table III for deltas. See table I for test conditions. 4.2 Table III. Burn-in test delta limits. Table III TEST BURN-IN LIFETEST DELTA TITLE ENDPOINT ENDPOINT LIMIT UNITS VFR 10.55 ± 0.55 10.55 ± 0.75 ±0.2 V VZS ±0.013 ±0.018 ±0.005 %FS I+ 8.33 8.33 ±10% mA I- 8.33 8.33 ±10% mA 5.0 Life Test/Burn-In Circuit: 5.1 HTRB is not applicable for this drawing. 5.2 Burn-in is per MIL-STD-883 Method 1015 test condition B. 5.3 Steady state life test is per MIL-STD-883 Method 1005. Table II MIL-STD-883 Test Requirements Subgroups (see table I) Interim electrical parameters (pre Burn-In) 1 Final Electrical Test Parameters 1, 2, 3, 8 1/ 2/ Group A Test Requirements 1, 2, 3, 8, 9 Group C Test Requirements 1 2/ Group D Test Requirements 1 * PDA applies to Subgroup 1 only. No other subgroups are included in PDA. |
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