Data Sheet Rev. 1.4

7

2001-10-18

TLE 4290

Note: The listed characteristics are ensured over the operating range of the integrated

circuit. Typical characteristics specify mean values expected over the production

spread. If not otherwise specified, typical characteristics apply at

T

the given supply voltage.

Figure 3

Test Circuit

Power Good switching

threshold

V

Q,pgt-d

3.50

3.65

3.80

V

V

Power Good output low

voltage

V

PGL

–

0.2

0.4

V

R

V

Power Good output

leakage current

I

PGH

–

02

µA

V

Power Good charging

current

I

D,c

36

9

µA

V

Upper timing threshold

V

DU

1.5

1.8

2.2

V

–

Lower timing threshold

V

DL

0.60

0.85

1.10

V

–

Power Good delay time

t

rd

10

16

22

ms

C

Power Good reaction time

t

rr

0.2

0.5

2.0

µs

C

1)

Measured when the output voltage

V

Characteristics (cont’d)

V

Parameter

Symbol

Limit Values

Unit

Measuring

Condition

min.

typ.

max.

AES02824

TLE 4290

5

2

GND

I

D

C

I2

100 nF

C

I1

1000 µF

C

D

47 nF

I

D,C

I

I

V

I

I

Q

R

PG

5 k

V

Q

I

GND

V

PG

C

Q

22 µF

Q

PG

I

D

4

1