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CY7C1663KV18 Datasheet(PDF) 28 Page - Cypress Semiconductor |
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CY7C1663KV18 Datasheet(HTML) 28 Page - Cypress Semiconductor |
28 / 31 page Document Number: 001-44060 Rev. *O Page 28 of 31 CY7C1663KV18/CY7C1665KV18 Acronyms Document Conventions Units of Measure Acronym Description BWS Byte Write Select DDR Double Data Rate DLL Delay Lock Loop FBGA Fine-Pitch Ball Grid Array HSTL High-Speed Transceiver Logic I/O Input/Output JTAG Joint Test Action Group LSB Least Significant Bit LSBU Logical Single-Bit Upsets LMBU Logical Multi-Bit Upsets MSB Most Significant Bit PLL Phase Locked Loop QDR Quad Data Rate SEL Single Event Latch-up SRAM Static Random Access Memory TAP Test Access Port TCK Test Clock TDI Test Data-In TDO Test Data-Out TMS Test Mode Select Symbol Unit of Measure °C degree Celsius FIT/Dev failure in time per device FIT/Mb failure in time per mega bit MHz megahertz µA microampere µs microsecond mA milliampere mm millimeter ms millisecond ns nanosecond ohm pF picofarad Vvolt Wwatt |
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