ISL26320, ISL26321, ISL26322, ISL26323, ISL26324, ISL26325, ISL26329

FN8273 Rev 1.00

Page 8 of 23

September 5, 2013

Acquisition Time in Auto Sleep Mode

1.7

µs

Acquisition time in Auto Power Down

Mode

150

µs

SCLK High Time

20

ns

SCLK Low Time

20

ns

CNV Pulse Width

100

ns

NOTES:

6. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.

7. The device may become nonresponsive if the minimum acquisition times are not met in their respective modes, requiring a power cycle to restore

normal operation.

8. Transition time to high impedance state is dominated by RC loading on the SDOUT pin. Specified value is measured using equivalent loading shown

in Figure 2.

at +25°C), unless otherwise specified. Boldface limits apply over the operating temperature range, -40°C to +125°C. (Continued)

SYMBOL

PARAMETER

TEST LEVEL OR NOTES

MIN

(Note 6)

TYP

MAX

(Note 6)

UNITS

FIGURE 2. EQUIVALENT LOAD CIRCUIT FOR DIGITAL OUTPUT TESTING

OUTPUT PIN

10pF

VDD

2k