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MAX1973EUB Datasheet(PDF) 4 Page - Maxim Integrated Products |
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MAX1973EUB Datasheet(HTML) 4 Page - Maxim Integrated Products |
4 / 8 page V. Quality Assurance Information A. Quality Assurance Contacts: Jim Pedicord (Reliability Lab Manager) Bryan Preeshl ( Executive Director of QA) Kenneth Huening (Vice President) B. Outgoing Inspection Level: 0.1% for all electrical parameters guaranteed by the Datasheet. 0.1% For all Visual Defects. C. Observed Outgoing Defect Rate: < 50 ppm D. Sampling Plan: Mil-Std-105D VI. Reliability Evaluation A. Accelerated Life Test The results of the 135 °C biased (static) life test are shown in Table 1. Using these results, the Failure Rate ( λ) is calculated as follows: λ = 1 = 1.83 (Chi square value for MTTF upper limit) MTTF 192 x 4389 x 90 x 2 Temperature Acceleration factor assuming an activation energy of 0.8eV λ = 12.07 x 10-9 λ = 12.07 F.I.T. (60% confidence level @ 25°C) This low failure rate represents data collected from Maxim’s reliability qualification and monitor programs. Maxim also performs weekly Burn-In on samples from production to assure reliability of its processes. The reliability required for lots which receive a burn-in qualification is 59 F.I.T. at a 60% confidence level, which equates to 3 failures in an 80 piece sample. Maxim performs failure analysis on rejects from lots exceeding this level. The Burn-In Schematic (Spec.# 06-5984) shows the static circuit used for this test. Maxim also performs 1000 hour life test monitors quarterly for each process. This data is published in the Product Reliability Report (RR-1M) located on the Maxim website at http://www.maxim-ic.com . B. Moisture Resistance Tests Maxim evaluates pressure pot stress from every assembly process during qualification of each new design. Pressure Pot testing must pass a 20% LTPD for acceptance. Additionally, industry standard 85 °C/85%RH or HAST tests are performed quarterly per device/package family. C. E.S.D. and Latch-Up Testing The PM27 die type has been found to have all pins able to withstand a transient pulse of ±1500V, per Mil- Std-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device withstands a current of ±250mA. |
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