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HCF4041UM013TR Datasheet(PDF) 4 Page - STMicroelectronics |
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HCF4041UM013TR Datasheet(HTML) 4 Page - STMicroelectronics |
4 / 8 page HCF4041UB 4/8 DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns) (*) Typical temperature coefficient for all VDD value is 0.3 %/°C. TEST CIRCUIT CL = 50pF or equivalent (includes jig and probe capacitance) RL = 200KΩ RT = ZOUT of pulse generator (typically 50Ω) Symbol Parameter Test Condition Value (*) Unit VDD (V) Min. Typ. Max. tPLH tPHL Propagation Delay Time 5 60 120 ns 10 35 70 15 25 50 tTLH tTHL Output Transition Time 5 40 80 ns 10 20 40 15 15 30 |
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