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MAX3205E Datasheet(PDF) 5 Page - Maxim Integrated Products |
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MAX3205E Datasheet(HTML) 5 Page - Maxim Integrated Products |
5 / 13 page Applications Information Design Considerations Maximum protection against ESD damage results from proper board layout (see the Layout Recommendations section). A good layout reduces the parasitic series inductance on the ground line, supply line, and protect- ed signal lines. The MAX3205E/MAX3207E/MAX3208E ESD diodes clamp the voltage on the protected lines during an ESD event and shunt the current to GND or VCC. In an ideal circuit, the clamping voltage (VC) is defined as the forward voltage drop (VF) of the protec- tion diode, plus any supply voltage present on the cath- ode. For positive ESD pulses: VC = VCC + VF For negative ESD pulses: VC =-VF The effect of the parasitic series inductance on the lines must also be considered (Figure 1). For positive ESD pulses: For negative ESD pulses: where, IESD is the ESD current pulse. During an ESD event, the current pulse rises from zero to peak value in nanoseconds (Figure 2). For example, in a 15kV IEC-61000 Air-Gap Discharge ESD event, the pulse current rises to approximately 45A in 1ns (di/dt = 45 x 109). An inductance of only 10nH adds an addi- tional 450V to the clamp voltage, and represents approximately 0.5in of board trace. Regardless of the device’s specified diode clamp voltage, a poor layout with parasitic inductance significantly increases the effective clamp voltage at the protected signal line. Minimize the effects of parasitic inductance by placing the MAX3205E/MAX3207E/MAX3208E as close to the connector (or ESD contact point) as possible. A low-ESR 0.1µF capacitor is recommended between VCC and GND in order to get the maximum ESD protec- tion possible. This bypass capacitor absorbs the charge transferred by a positive ESD event. Ideally, the supply rail (VCC) would absorb the charge caused by a positive ESD strike without changing its regulated value. All power supplies have an effective output impedance on their positive rails. If a power supply’s effective output impedance is 1 Ω, then by using V = I x R, the clamping voltage of VC increases by the equa- tion VC = IESD x ROUT. A +8kV IEC 61000-4-2 ESD event generates a current spike of 24A. The clamping voltage increases by VC = 24A x 1 Ω, or VC = 24V. Again, a poor layout without proper bypassing increas- es the clamping voltage. A ceramic chip capacitor mounted as close as possible to the MAX3205E/ MAX3207E/MAX3208E VCC pin is the best choice for this application. A bypass capacitor should also be placed as close to the protected device as possible. VV L x dI dt Lx dI dt CF D ESD ESD () () =− + ⎛ ⎝⎜ ⎞ ⎠⎟ + ⎛ ⎝⎜ ⎞ ⎠⎟ ⎛ ⎝⎜ ⎞ ⎠⎟ ()2 13 VV V L x dI dt Lx dI dt CCC F D ESD ESD () () =+ + ⎛ ⎝⎜ ⎞ ⎠⎟ +⎛ ⎝⎜ ⎞ ⎠⎟ ()1 12 Dual, Quad, and Hex High-Speed Differential ESD-Protection ICs _______________________________________________________________________________________ 5 L1 PROTECTED LINE L3 D2 GROUND RAIL POSITIVE SUPPLY RAIL I/O_ D1 L2 Figure 1. Parasitic Series Inductance tR = 0.7ns to 1ns 30ns 60ns t 100% 90% 10% I Figure 2. IEC 61000-4-2 ESD Generator Current Waveform |
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