17

CMOS LOGIC IC ELM7S00,ELM7S00B 2-input NAND Gate

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TEST CIRCUIT

* Output should be opened when measuring current consumption.

6 ns

6 ns

tPHL

tTHL

tTLH

90%

50%

10%

90%

tPLH

50%

10%

90%

50%

10%

10%

50%

90%

INPUT

OUTPUT

GND

VCC

VOH

VOL

P u l s e

O s c i l l a t o r

V C C

I N P U T

C L

O U T P U T

50Ω

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MEASURED WAVE PATTERN

Parameter

Sym.

VCC Min. Typ. Max.

Min.

Max.

Units Conditions

2.0

-

18

125

-

155

tTLH

4.5

-

7

25

-

31

ns

High-Output

6.0

-

6

21

-

26

Refer to

Down-time

2.0

-

14

125

-

155

test circuit

tTHL

4.5

-

6

25

-

31

ns

6.0

-

6

21

-

26

2.0

-

16

100

-

125

tPLH

4.5

-

8

20

-

25

ns

Propagation

6.0

-

7

17

-

21

Refer to

Delay-time

2.0

-

16

100

-

125

test circuit

tPHL

4.5

-

6

20

-

25

ns

6.0

-

5

17

-

21

Input Capacity

CIN

-

-

5

10

-

10

pF

Equivalent Inner Capacity

CPD

-

-

10

-

-

-

pF

Top = -40∼+85℃

Top = 25℃

( CL=50pF, tr=tf=6ns )

* CPD is IC's inner equivalent capacity which is calculated from non-loaded operating current consumption

referred to following test circuit. Averaged operating current consumption at non-load is calculated as

following formula

;

ICC (opr) = CPD ・ VCC ・ fIN + ICC