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AS7C34096-12JC Datasheet(PDF) 2 Page - Alliance Semiconductor Corporation |
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AS7C34096-12JC Datasheet(HTML) 2 Page - Alliance Semiconductor Corporation |
2 / 9 page ® AS7C4096 AS7C34096 1/13/05; v.1.9 Alliance Semiconductor P. 2 of 9 Functional description The AS7C4096 and AS7C34096 are high-performance CMOS 4,194,304-bit Static Random Access Memory (SRAM) devices organized as 524,288 words × 8 bits. They are designed for memory applications where fast data access, low power, and simple interfacing are desired. Equal address access and cycle times (tAA, tRC, tWC) of 10/12/15/20 ns with output enable access times (tOE) of 5/6/7/8 ns are ideal for high-performance applications. The chip enable input CE permits easy memory expansion with multiple-bank memory systems. When CE is high the device enters standby mode. The AS7C4096/AS7C34096 is guaranteed not to exceed 110/72 mW power consumption in CMOS standby mode. A write cycle is accomplished by asserting write enable (WE) and chip enable (CE). Data on the input pins I/O1–I/O8 is written on the rising edge of WE (write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices should drive I/ O pins only after outputs have been disabled with output enable (OE) or write enable (WE). A read cycle is accomplished by asserting output enable (OE) and chip enable (CE), with write enable (WE) high. The chip drives I/O pins with the data word referenced by the input address. When either chip enable or output enable is inactive, or write enable is active, output drivers stay in high-impedance mode. All chip inputs and outputs are TTL-compatible, and operation is from either a single 5V(AS7C4096) or 3.3V(AS7C34096) supply. Both devices are available in the JEDEC standard 400-mil 36-pin SOJ and 44-pin TSOP 2 packages. NOTE: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and func- tional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Key: X = Don’t care, L = Low, H = High Absolute maximum ratings Parameter Device Symbol Min Max Unit Voltage on VCC relative to GND AS7C4096 Vt1 –1 +7.0 V AS7C34096 Vt1 –0.5 +5.0 V Voltage on any pin relative to GND Vt2 –0.5 VCC +0.5 V Power dissipation PD –1.0 W Storage temperature Tstg –65 +150 °C Temperature with VCC applied Tbias –55 +125 °C DC current unto output (low) IOUT –20 mA Truth table CE WE OE Data Mode H X X High Z Standby (ISB, ISB1) L H H High Z Output disable (ICC) LHL DOUT Read (ICC) LL X DIN Write (ICC) |
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