3
White Electronic Designs Corporation (602) 437-1520 www.whiteedc.com
WSF128K32-XH2X
White Electronic Designs
Parameter
Symbol
-25
Unit
Read Cycle
Min
Max
Read Cycle Time
tRC
25
ns
Address Access Time
tAA
25
ns
Output Hold from Address Change
tOH
0ns
Chip Select Access Time
tACS
25
ns
Output Enable to Output Valid
tOE
15
ns
Chip Select to Output in Low Z
tCLZ1
3ns
Output Enable to Output in Low Z tOLZ1
0ns
Chip Disable to Output in High Z
tCHZ1
12
ns
Output Disable to Output in High Z
tOHZ1
12
ns
1. This parameter is guaranteed by design but not tested.
SRAM AC CHARACTERISTICS
(VCC = 5.0V, TA = -55°C TO +125°C)
Parameter
Symbol
-25
Unit
Write Cycle
Min
Max
Write Cycle Time
tWC
25
ns
Chip Select to End of Write
tCW
20
ns
Address Valid to End of Write
tAW
20
ns
Data Valid to End of Write
tDW
15
ns
Write Pulse Width
tWP
20
ns
Address Setup Time
tAS
0ns
Address Hold Time
tAH
0ns
Output Active from End of Write
tOW1
3ns
Write Enable to Output in High Z
tWHZ1
15
ns
Data Hold from Write Time
tDH
0ns
1. This parameter is guaranteed by design but not tested.
SRAM AC CHARACTERISTICS
(VCC = 5.0V, TA = -55°C TO +125°C)
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 W.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0 V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
I
Current Source
D.U.T.
C
= 50 pf
eff
I
OL
V
≈ 1.5V
(Bipolar Supply)
Z
Current Source
OH
FIG. 2 AC TEST CIRCUIT
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