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MC100LVEP111 Datasheet(PDF) 4 Page - ON Semiconductor |
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MC100LVEP111 Datasheet(HTML) 4 Page - ON Semiconductor |
4 / 8 page MC100LVEP111 http://onsemi.com 4 Table 4. MAXIMUM RATINGS Symbol Parameter Condition 1 Condition 2 Rating Unit VCC PECL Mode Power Supply VEE = 0 V 6 V VEE NECL Mode Power Supply VCC = 0 V −6 V VI PECL Mode Input Voltage NECL Mode Input Voltage VEE = 0 V VCC = 0 V VI ≤ VCC VI ≥ VEE 6 −6 V V Iout Output Current Continuous Surge 50 100 mA mA IBB VBB Sink/Source ± 0.5 mA TA Operating Temperature Range −40 to +85 °C Tstg Storage Temperature Range −65 to +150 °C qJA Thermal Resistance (Junction−to−Ambient) 0 lfpm 500 lfpm LQFP−32 LQFP−32 80 55 °C/W °C/W qJC Thermal Resistance (Junction−to−Case) Standard Board LQFP−32 12 to 17 °C/W qJA Thermal Resistance (Junction−to−Ambient) 0 lfpm 500 lfpm QFN−32 QFN−32 31 27 °C/W °C/W qJC Thermal Resistance (Junction−to−Case) 2S2P QFN−32 12 °C/W Tsol Wave Solder Pb Pb−Free (QFN−32 Only) < 3 sec @ 248°C < 3 sec @ 260°C 265 265 °C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. |
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