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08051A101JATUA Datasheet(PDF) 2 Page - AVX Corporation |
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08051A101JATUA Datasheet(HTML) 2 Page - AVX Corporation |
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2 / 4 page  4 C0G (NP0) Dielectric Specifications and Test Methods Parameter/Test NP0 Specification Limits Measuring Conditions Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber Capacitance Within specified tolerance <30 pF: Q≥ 400+20 x Cap Value ≥30 pF: Q≥ 1000 Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF 1.0 kHz ± 10% for cap > 1000 pF Voltage: 1.0Vrms ± .2V Q Insulation Resistance 100,000MΩ or 1000MΩ - µF, whichever is less Charge device with rated voltage for 60 ± 5 secs @ room temp/humidity Dielectric Strength No breakdown or visual defects Charge device with 250% of rated voltage for 1-5 seconds, w/charge and discharge current limited to 50 mA (max) Note: Charge device with 150% of rated voltage for 500V devices. Resistance to Flexure Stresses Appearance No defects Deflection: 2mm Test Time: 30 seconds Capacitance Variation ±5% or ±.5 pF, whichever is greater Q Meets Initial Values (As Above) Insulation Resistance ≥ Initial Value x 0.3 Solderability ≥ 95% of each terminal should be covered with fresh solder Dip device in eutectic solder at 230 ± 5ºC for 5.0 ± 0.5 seconds Resistance to Solder Heat Appearance No defects, <25% leaching of either end terminal Dip device in eutectic solder at 260ºC for 60sec- onds. Store at room temperature for 24 ± 2hours before measuring electrical properties. Capacitance Variation ≤ ±2.5% or ±.25 pF, whichever is greater Q Meets Initial Values (As Above) Insulation Resistance Meets Initial Values (As Above) Dielectric Strength Meets Initial Values (As Above) Thermal Shock Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes Capacitance Variation ≤ ±2.5% or ±.25 pF, whichever is greater Step 2: Room Temp ≤ 3 minutes Q Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes Insulation Resistance Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes Dielectric Strength Meets Initial Values (As Above) Repeat for 5 cycles and measure after 24 hours at room temperature Load Life Appearance No visual defects Charge device with twice rated voltage in test chamber set at 125ºC ± 2ºC for 1000 hours (+48, -0). Remove from test chamber and stabilize at room temperature for 24 hours before measuring. Capacitance Variation ≤ ±3.0% or ± .3 pF, whichever is greater Q (C=Nominal Cap) ≥ 30 pF: Q≥ 350 ≥10 pF, <30 pF: Q≥ 275 +5C/2 <10 pF: Q≥ 200 +10C Insulation Resistance ≥ Initial Value x 0.3 (See Above) Dielectric Strength Meets Initial Values (As Above) Load Humidity Appearance No visual defects Store in a test chamber set at 85ºC ± 2ºC/ 85% ± 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room temperature for 24 ± 2 hours before measuring. Capacitance Variation ≤ ±5.0% or ± .5 pF, whichever is greater Q ≥ 30 pF: Q≥ 350 ≥10 pF, <30 pF: Q≥ 275 +5C/2 <10 pF: Q≥ 200 +10C Insulation Resistance ≥ Initial Value x 0.3 (See Above) Dielectric Strength Meets Initial Values (As Above) 051818 |
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