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BQ77904 Datasheet(PDF) 17 Page - Texas Instruments

Part # BQ77904
Description  BQ77904, BQ77905 3-Series to 20-Series Ultra Low-Power Voltage, Current, Temperature, and Open-Wire Stackable Lithium-Ion Battery Protector
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
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BQ77904 Datasheet(HTML) 17 Page - Texas Instruments

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• Load removal detected only, VLD < VLDT OR
• Overcurrent Recovery Timer, tCD_REC, expiration only OR
• Overcurrent Recovery Timer expiration and load removal are detected.
8.3.2.7 Overcurrent Recovery Timer
The timer expiration method activates an internal recovery timer as soon as the initial fault condition exceeds the
OCD1/OCD2/SCD time. When the recovery timer reaches its limit, both CHG and DSG drivers are turned back
on. If the combination option of timer expiration AND load removal is used, then the load removal condition is
only evaluated upon expiration of the recovery timer, which can have an expiration period of tCD_REC.
8.3.2.8 Load Removal Detection
The load removal detection feature is implemented with the LD pin (see Table 8-2). When no undervoltage fault
and current fault conditions are present, the LD pin is held in an open-drain state. Once any UV, OCD1, OCD2,
or SCD fault occurs and load removal is selected as part of the recovery conditions, a high impedance pull-down
path to VSS is enabled on the LD pin. With an external load still present, the LD pin will be externally pulled high:
It is internally clamped to VLDCLAMP and should also be resistor-limited through RLD externally to avoid
conducting excessive current. If the LD pin exceeds VLDT, this is interpreted as a load present condition. When
the load is eventually removed, the internal high-impedance path to VSS should be sufficient to pull the LD pin
below VLDT for tLD_DEG. This is interpreted as a load removed condition and is one of the recovery mechanisms
selectable for undervoltage and overcurrent faults.
RLD
LD
pin
Load Detect
block
RLD_INT
VLDT
bq77094/5
PACK-
PACK+
LOAD
When load detect is
enabled, the LD pin is
connected to Vss via the
RLD_INT.
The load, RLD and RLD_INT
create a resister divider,
which the load detect
circuit is used to detect
when the load is removed.
Figure 8-3. Load Detection Circuit for Current Faults Recovery
Table 8-2. Load State
LD PIN
LOAD STATE
≥ VLDT
Load present
< VLOT for tLD_DEG
Load removed
8.3.2.9 Load Removal Detection in UV
During a UV fault, only the DSG FET driver is turned off while the CHG FET driver remains on. When load
removal is selected as part of the UV recovery condition, the active CHG FET driver would alter the resistor
divider ratio of the load detection circuit. To ensure the load status can still be detected properly, it is required to
increase the CHG FET external RGS value to about 3 MΩ. Refer to the Section 9.1.1.4 section for more detail.
Note that if load removal is only selected for the current fault recovery (and is not used for UV recovery), it is not
required to use a larger CHG FET RGS value.
www.ti.com
BQ77904, BQ77905
SLUSCM3K – APRIL 2020 – REVISED JULY 2020
Copyright © 2020 Texas Instruments Incorporated
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