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ALD1121ESA Datasheet(PDF) 2 Page - Advanced Linear Devices |
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ALD1121ESA Datasheet(HTML) 2 Page - Advanced Linear Devices |
2 / 8 page ALD1123E/ALD1121E Advanced Linear Devices 2 GENERAL DESCRIPTION ALD1123E/ALD1121E are monolithic quad/dual EPAD® (Electrically Program- mable Analog Device) N-channel MOSFETs with electrically adjustable threshold (turn-on) voltage. The ALD1123E/ALD1121E are precision matched and adjusted (e-trimmed) at the factory resulting in quad/dual MOSFETs that are highly matched in electrical characteristics. The ALD1123E has four (4) separate source pins. SN1, SN2 share a common substrate pin V-1 which has to be connected to the most negative voltage potential. Likewise, SN3, SN4 share a common substrate pin V-2 which has to be connected to the negative voltage potential for SN3, SN4. The ALD1121E has two (2) separate source pins (SN1, SN2). Both SN1, SN2 share a common substrate pin 4 which has to be connected to the most negative voltage potential. Using an ALD1123E/ALD1121E MOSFET array is simple and straight forward. The MOSFETs function in electrical characteristics as n-channel MOSFETs except that all the devices have exceptional matching to each other. For a given input voltage, the threshold voltage of a MOSFET device determines its drain on-current, resulting in an on-resistance characteristic that can be precisely preset and then controlled by the input voltage very accurately. Since these devices are on the same monolithic chip, they also exhibit excellent tempco matching characteristics. These MOSFET devices have very low input currents, and as a result a very high input impedance (>10 12 Ohm). The gate voltage from a control source can drive many MOSFET inputs with practically no loading effects. Used in precision current mirror or current multiplier applications, they can be used to provide a current source over a 100 nA to 3 mA range, and with either a positive, negative or zero tempco. Optional EPAD Threshold Voltage Trimming By User The basic EPAD MOSFET device is a monotonically adjustable device which means the device can normally be e-trimmed to increase in threshold voltage and to decrease in drain-on current as a function of a given input bias voltage. Used as an in-circuit element for trimming or setting a combination of voltage and/or current characteristics, it can be e-trimmed remotely and automatically. Once e-trimmed, the set voltage and current levels are stored indefinitely inside the device as a nonvolatile stored charge, which is not affected during normal operation of the device, even when power is turned off. A given EPAD device can be adjusted many times to continually increase its threshold voltage. A pair of EPAD devices can also be connected differentially such that one device is used to adjust a parameter in one direction and the other device is used to adjust the same parameter in the other direction. The ALD1123E/ALD1121E can be e-trimmed with the ALD EPAD programmer to obtain the desired voltage and current levels. Or they can be e-trimmed as an active in-system element in a user system, via user designed interface circuitry. PN1, PN2, etc., are pins required for optional e-trim of respective MOSFET devices. If unused, these pins are to be connected to V- or ground. For more information, see Application Note AN1108. APPLICATIONS • Precision PC-based electronic calibration • Automated voltage trimming or setting • Remote voltage or current adjustment of inaccessible nodes • PCMCIA based instrumentation trimming • Electrically adjusted resistive load • Temperature compensated current sources and current mirrors • Electrically trimmed/calibrated current sources • Permanent precision preset voltage level shifter • Low temperature coefficient voltage and/or current bias circuits • Multiple preset voltage bias circuits • Multiple channel resistor pull-up or pull-down circuits • Microprocessor based process control systems • Portable data acquisition systems • Battery operated terminals and instruments • Remote telemetry systems • E-trim gain amplifiers • Low level signal conditioning • Sensor and transducer bias currents • Neural networks BLOCK DIAGRAM BLOCK DIAGRAM ALD1121E ALD1123E PN1 (1) DN1 (3) GN1(2) DN2 (7) PN2 (5) GN2 (6) SN2 (8) M 1 M 2 SN1(4) V- (4) M 1 M 2 M 3 M 4 PN4 (5) PN1 (1) DN1 (3) GN1(2) DN2 (15) PN2 (13) GN2 (14) PN3 (9) DN3 (11) GN3(10) DN4 (7) GN4 (6) SN1 (4) SN2 (16) SN3 (12) SN4 (8) V-2 (8) V-1 (4) |
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