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ADIS16489 Datasheet(PDF) 5 Page - Analog Devices

Part # ADIS16489
Description  Seven Degrees of Freedom Inertial Sensor
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADIS16489 Datasheet(HTML) 5 Page - Analog Devices

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Data Sheet
ADIS16489
Rev. B | Page 5 of 40
Parameter
Test Conditions/Comments
Min
Typ
Max
Unit
TEMPERATURE SENSOR
Scale Factor
Output = 0x0000 at 25°C (±5°C)
0.00565
°C/LSB
LOGIC INPUTS7
Input Voltage
High, VIH
2.0
V
Low, VIL
0.8
V
RST Pulse Width
1
µs
CS Wake-Up Pulse Width
20
µs
Input Current
Logic 1 (High), IIH
VIH = 3.3 V
10
µA
Logic 0 (Low), IIL
VIL = 0 V
All Pins Except RST
10
µA
RST Pin
0.33
mA
Input Capacitance, CIN
10
pF
DIGITAL OUTPUTS
Output Voltage
High, VOH
ISOURCE = 0.5 mA
2.4
V
Low, VOL
ISINK = 2.0 mA
0.4
V
FLASH MEMORY
Endurance8
100,000
Cycles
Data Retention9
TJ = 85°C
20
Years
FUNCTIONAL TIMES10
Time until data is available
Power-On Start-Up Time
600
ms
Back-up
1370
1500
ms
Reset Recovery Time11
390
600
ms
Sleep Mode Recovery Time
730
1000
µs
Flash Memory
Update Time12
1.05
6.8
sec
Test Time
50
ms
On Demand Self Test Time
Using internal clock (2460 Hz)
12
ms
CONVERSION RATE
2.46
kSPS
Initial Clock Accuracy
0.02
%
Temperature Coefficient
40
ppm/°C
Sync Input Clock13
0.7
2.4
kHz
POWER SUPPLY, VDD
Operating voltage range, VDD = 3.3 V
3.0
3.6
V
Power Supply Current, IDD14
Normal mode, µ ± σ
186
mA
Sleep mode
12.2
mA
Power-down mode
37
µA
POWER SUPPLY, VDDRTC
Operating voltage range
3.0
3.3
3.6
V
Real-Time Clock Supply Current
Normal mode, VDDRTC = 3.3 V
13
µA
1
The repeatability specifications represent analytical projections based on the following drift contributions and conditions: temperature hysteresis (−40°C to +85°C),
electronics drift (high temperature operating life test: 110°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles, −55°C to +85°C), rate
random walk (10-year projection), and broadband noise.
2
Bias repeatability describes a long-term behavior over a variety of conditions. Short-term repeatability relates to the in-run bias stability and noise density specifications.
3
All specifications associated with the accelerometers relate to the full-scale range of ±18 g.
4
X-ray exposure can degrade this performance metric.
5
The relative error assumes that the initial error, at 25°C, is corrected in the end application.
6
Specification assumes a full scale (FS) of 1000 mbar.
7
The digital I/O signals use a 3.3 V system.
8
Endurance is qualified as per JEDEC Standard 22, Method A117, measured at −40°C, +25°C, +85°C, and +125°C.
9
The data retention specification assumes a junction temperature (TJ) of 85°C per JEDEC Standard 22, Method A117. Data retention lifetime decreases with TJ.
10
These times do not include thermal settling and internal filter response times, which may affect overall accuracy.
11
The RST line must be in a low state for at least 10 μs to ensure a proper reset initiation and recovery.
12
Monitoring the data ready signal (see Table 153 for FNCTIO_CTRL configuration) for the return of regular pulsing can help minimize system wait times.
13
The device functions at clock rates below 0.7 kHz but at reduced performance levels.
14
Supply current transients can reach 600 mA during initial startup or reset recovery.


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