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TMS417400A Datasheet(PDF) 7 Page - Texas Instruments |
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TMS417400A Datasheet(HTML) 7 Page - Texas Instruments |
7 / 27 page TMS416400A, TMS417400A 4194304 BY 4-BIT DYNAMIC RANDOM-ACCESS MEMORIES SMKS889B – AUGUST 1996 – REVISED OCTOBER 1997 7 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251–1443 test mode (continued) Test Mode Cycle Entry Cycle Exit Cycle Normal Mode RAS CAS W NOTE A: The states of W, data in, and address are defined by the type of cycle used during test mode. Figure 1. Test-Mode Cycle |
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