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WCSS0418V1F-100AI Datasheet(PDF) 9 Page - Weida Semiconductor, Inc.

Part # WCSS0418V1F-100AI
Description  256K x 18 Synchronous 3.3V Cache RAM
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Manufacturer  WEIDA [Weida Semiconductor, Inc.]
Direct Link  http://www.weida.com.my/website/
Logo WEIDA - Weida Semiconductor, Inc.

WCSS0418V1F-100AI Datasheet(HTML) 9 Page - Weida Semiconductor, Inc.

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WCSS0418V1F
Document #: 38-05245 Rev. **
Page 9 of 18
Switching Characteristics Over the Operating Range[10]
Parameter
Description
-117
-100
Min.
Max.
Min.
Max.
Unit
tCYC
Clock Cycle Time
8.5
10
ns
tCH
Clock HIGH
3.0
4.0
ns
tCL
Clock LOW
3.0
4.0
ns
tAS
Address Set-Up Before CLK Rise
2.0
2.0
ns
tAH
Address Hold After CLK Rise
0.5
0.5
ns
tCDV
Data Output Valid After CLK Rise
7.5
8.0
ns
tDOH
Data Output Hold After CLK Rise
2.0
2.0
ns
tADS
ADSP, ADSC Set-Up Before CLK Rise
2.0
2.0
ns
tADH
ADSP, ADSC Hold After CLK Rise
0.5
0.5
ns
tWES
BWS[1:0], GW, BWE Set-Up Before CLK Rise
2.0
2.0
ns
tWEH
BWS[1:0], GW, BWE Hold After CLK Rise
0.5
0.5
ns
tADVS
ADV Set-Up Before CLK Rise
2.0
2.0
ns
tADVH
ADV Hold After CLK Rise
0.5
0.5
ns
tDS
Data Input Set-Up Before CLK Rise
2.0
2.0
ns
tDH
Data Input Hold After CLK Rise
0.5
0.5
ns
tCES
Chip Enable Set-Up
2.0
2.0
ns
tCEH
Chip Enable Hold After CLK Rise
0.5
0.5
ns
tCHZ
Clock to High-Z[11, 12]
3.5
3.5
ns
tCLZ
Clock to Low-Z[11, 12]
00
ns
tEOHZ
OE HIGH to Output High-Z[11, 13]
3.5
3.5
ns
tEOLZ
OE LOW to Output Low-Z[11, 13]
00
ns
tEOV
OE LOW to Output Valid
3.5
3.5
ns
Notes:
10. Unless otherwise noted, test conditions assume signal transition time of 2.5 ns or less, timing reference levels of 1.25V, input pulse levels of 0 to 2.5V, and
output loading of the specified IOL/IOH and load capacitance. Shown in (a) and (b) of AC Test Loads.
11. tCHZ, tCLZ, tEOHZ, and tEOLZ are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ± 200 mV from steady-state
voltage.
12. At any given voltage and temperature, tCHZ (max.) is less than tCLZ (min.).
13. This parameter is sampled and not 100% tested.


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