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10H20EV8-4F Datasheet(PDF) 9 Page - NXP Semiconductors |
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10H20EV8-4F Datasheet(HTML) 9 Page - NXP Semiconductors |
9 / 17 page Philips Semiconductors Programmable Logic Devices Product specification 10H20EV8/10020EV8 ECL programmable array logic October 22, 1993 121 AC TEST CIRCUIT PULSE GENERATOR SCOPE RT L1 L3 VCC VCO1 VCO2 VEE SCOPE L2 RT CL I1 I11 CLK/I12 FM FN FX FY DUT +2.0V + 0.010V –2.5V + 0.010V FOR 10020EV8 –3.2V + 0.010V FOR 10H20EV8 25 µF 0.01 µF NOTES: 1. Use decoupling capacitors of 0.1 µF and 25µF from GND to VCC, and 0.01µF and 25µF from GND to VEE (0.01 and 0.1µF capacitors should be NPO Ceramic or MLC type). Decoupling capacitors should be placed as close as physically possible to the DUT and lead length should be kept to less than 1/4 inch (6mm). 2. All unused inputs should be connected to either HIGH or LOW state consistent with the LOGIC function required. 3. All unused outputs are loaded with 50 Ω to GND. 4. L1 and L2 are equal length 50Ω impedance lines. L3, the distance from the DUT pin to the junction of the cable from the Pulse Generator and the cable to the Scope, should not exceed 1/4 inch (6mm). 5. RT = 50Ω terminator internal to Scope. 6. The unmatched wire stub between coaxial cable and pins under test must be less than 1/4 inch (6mm) long for proper test. 7. CL = Fixture and stray capacitance ≤ 3pF. 8. Any unterminated stubs connected anywhere along the transmission line between the Pulse Generator and the DUT or between the DUT and the Scope should not exceed 1/4 inch (6mm) in length (refer to section on AC setup procedure). 9. All 50 Ω resistors should have tolerance of ± 1% or better. 10. Test procedures are shown for only one input or set of input conditions. Other inputs are tested in the same manner. 25 µF 0.1 µF |
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