Philips Semiconductors

Product specification

74ABT16244A

74ABTH16244A

16-bit buffer/line driver (3-State)

1998 Oct 07

5

DC ELECTRICAL CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

to +85

°C

UNIT

Min

Typ

Max

Min

Max

Input clamp voltage

–0.9

–1.2

–1.2

V

2.5

2.9

2.5

High-level output voltage

3.0

3.4

3.0

V

2.0

2.4

2.0

Low-level output voltage

0.42

0.55

0.55

V

Input leakage current

±0.01

±1.0

±1.0

µA

I

Input leakage current

or GND

Control pins

±0.01

±1

±1

A

In ut leakage current

74ABTH16244A

Data Pins

0.01

1

1

µA

Data Pins

–2

–3

–5

50

50

74ABTH16244A

–75

–75

µA

74ABTH16244A

±500

Power-off leakage current

±5.0

±100

±100

µA

Power-up/down 3-State

output current

±5.0

±50

±50

µA

3-State output High current

0.1

10

10

µA

3-State output Low current

–0.1

–10

–10

µA

Output High leakage current

5.0

50

50

µA

–50

–100

–180

–50

–180

mA

0.45

1.0

1.0

mA

10

19

19

mA

0.45

1.0

1.0

µA

Outputs enabled, one data input at 3.4V,

100

250

250

Additional supply current per

Outputs disabled, one data input at 3.4V,

100

250

250

µA

in ut in

Control pins, outputs disabled, one enable

100

250

250

NOTES:

1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.

2. This is the increase in supply current for each input at 3.4V.

3. This data sheet limit may vary among suppliers.

4. This is the bus hold overdrive current required to force the input to the opposite logic state.