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74ALVC16244DGG Datasheet(PDF) 4 Page - NXP Semiconductors |
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74ALVC16244DGG Datasheet(HTML) 4 Page - NXP Semiconductors |
4 / 10 page Philips Semiconductors Product specification 74ALVC16244/ 74ALVCH16244 16-bit buffer/line driver (3-State) 1998 Jun 29 4 RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER CONDITIONS LIMITS UNIT SYMBOL PARAMETER CONDITIONS MIN MAX UNIT DC supply voltage 2.5V range (for max. speed performance @ 30 pF output load) 2.3 2.7 VCC DC supply voltage 3.3V range (for max. speed performance @ 50 pF output load) 3.0 3.6 V DC supply voltage (for low-voltage applications) 1.2 3.6 For data input pins with bus hold 0 VCC VI DC Input voltage range For data input pins without bus hold 0 5.5 V For control pins 0 5.5 VO DC output voltage range 0 VCC V Tamb Operating free-air temperature range –40 +85 °C tr, tf Input rise and fall times VCC = 2.3 to 3.0V VCC = 3.0 to 3.6V 0 0 20 10 ns/V ABSOLUTE MAXIMUM RATINGS1 In accordance with the Absolute Maximum Rating System (IEC 134) Voltages are referenced to GND (ground = 0V) SYMBOL PARAMETER CONDITIONS RATING UNIT VCC DC supply voltage –0.5 to +4.6 V IIK DC input diode current VI t0 –50 mA For data inputs with bus hold2 –0.5 to VCC +0.5 VI DC input voltage For data inputs without bus hold2 –0.5 to +5.5 V For control pins2 –0.5 to +5.5 IOK DC output diode current VO uVCC or VO t 0 "50 mA VO DC output voltage Note 2 –0.5 to VCC +0.5 V IO DC output source or sink current VO = 0 to VCC "50 mA IGND, ICC DC VCC or GND current "100 mA Tstg Storage temperature range –65 to +150 °C PTOT Power dissipation per package –plastic medium-shrink (SSOP) –plastic thin-medium-shrink (TSSOP) For temperature range: –40 to +125 °C above +55 °C derate linearly with 11.3 mW/K above +55 °C derate linearly with 8 mW/K 850 600 mW NOTES: 1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed. |
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