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74F175AN Datasheet(PDF) 4 Page - NXP Semiconductors

Part # 74F175AN
Description  Quad D flip-flop
Download  10 Pages
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Manufacturer  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74F175AN Datasheet(HTML) 4 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74F175A
Quad D flip-flop
1996 Mar 12
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
NOM
MAX
VCC
Supply voltage
4.5
5.0
5.5
V
VIH
High-level input voltage
2.0
V
VIL
Low-level input voltage
0.8
V
IIK
Input clamp current
–18
mA
IOH
High-level output current
–1
mA
IOL
Low-level output current
20
mA
T
b
Operating free air temperature range
Commercial range
0
+70
°C
Tamb
Operating free air temperature range
Industrial range
–40
+85
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
CONDITIONS1
MIN
TYP2
MAX
VOH
High-level output voltage
VCC= MIN, VIL = MAX,
"10%VCC
2.5
V
VOH
High-level out ut voltage
CC
IL
VIH = MIN, IOH = MAX
"5%VCC
2.7
3.4
V
VOL
Low-level output voltage
VCC = MIN, VIL = MAX,
"10%VCC
0.30
0.5
V
CC
IL
VIH = MIN, IOL = MAX
"5%VCC
0.30
0.5
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = 0.0V, VI = 7.0V
100
µA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
VCC = MAX, VI = 0.5V
74F175A
–20
µA
IOS
Short-circuit output current3
VCC = MAX
–60
–150
mA
ICC
Supply current (total)
VCC = MAX
74F175A
22
31
mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS FOR 74F175A
LIMITS
Tamb = 25°C
Tamb = 0°C to +70°C
Tamb = *40°C to +85°C
SYMBOL
PARAMETER
TEST
VCC = +5V
VCC = +5.0V ± 10%
VCC = +5.0V ± 10%
UNIT
CONDITION
CL = 50pF,
RL = 500Ω
CL = 50pF,
RL = 500Ω
CL = 50pF,
RL = 500Ω
MIN
TYP
MAX
MIN
MAX
MIN
MAX
fmax
Maximum clock
frequency
Waveform 1
140
160
125
110
MHz
tPLH
tPHL
Propagation delay
CP to Qn or Qn
Waveform 1
3.0
4.5
4.0
6.0
6.5
8.5
2.5
4.0
7.5
9.0
2.5
4.0
8.0
10.0
ns
tPLH
tPHL
Propagation delay
MR to Qn
Waveform 3
4.5
6.5
9.0
4.5
10.0
4.5
11.0
ns
tPHL
tPHL
Propagation delay
MR to Qn
Waveform 3
4.5
6.0
8.0
4.0
9.0
4.0
10.0
ns


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