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74F655A Datasheet(PDF) 7 Page - NXP Semiconductors |
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74F655A Datasheet(HTML) 7 Page - NXP Semiconductors |
7 / 12 page Philips Semiconductors Product specification 74F655A* 74F656A Buffers/drivers 1991 Jul 17 7 * Discontinued part. Please see the Discontinued Products List. DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) NO TAG LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONSNO TAG MIN TYP NO TAG MAX VCC = MIN IO = 3mA ±10%VCC 2.4 V VOH High-level output voltage VCC = MIN, VIL = MAX V MIN IOH = –3mA ±5%VCC 2.7 3.3 V VIH = MIN IOH = –15mA ±10%VCC 2.0 V VO Low level output voltage VCC = MIN, V MAX IO = 64mA ±10%VCC 0.55 V VOL Low-level output voltage VIL = MAX VIH = MIN IOL = 64mA ±5%VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = 0.0, VI = 7.0V 100 µA Commercial Dn 40 µA I High-level Commercial range Pl, OEn VCC = MAX V =2 7V 20 µA IIH High level input current Industrial Dn VCC = MAX, VI = 2.7V 80 µA Industrial range Pl, OEn 40 µA I Low level input current Dn VCC = MAX V =0 5V –40 µA IIL Low-level input current Pl, OEn VCC = MAX, VI = 0.5V –20 µA IOZH Off-state current High-level voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off-state current Low-level voltage applied VCC = MAX, VO = 0.5V –50 µA IOS Short-circuit output current3 VCC = MAX –100 –225 mA ICCH 50 80 mA ICC Supply current (total) ICCL VCC = MAX 78 110 mA (total) ICCZ 83 90 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTICS LIMITS TEST Tamb = +25°C, V =+5 0V Tamb = 0°C to +70°C V =+5 0V ± 10% Tamb = –40°C to +85°C V =+5 0V ± 10% SYMBOL PARAMETER TEST CONDITIONS VCC = +5.0V CL = 50pF, VCC = +5.0V ± 10% CL = 50pF, VCC = +5.0V ± 10% CL = 50pF, UNIT CONDITIONS CL = 50pF, RL = 500Ω CL = 50pF, RL = 500Ω CL = 50pF, RL = 500Ω MIN TYP MAX MIN MAX MIN MAX tPLH tPHL Propagation delay Dn to Qn 74F655A Waveform 2 2.0 1.0 4.5 2.5 6.5 4.0 2.0 1.0 7.5 4.5 2.0 1.0 8.5 5.5 ns ns tPLH tPHL Propagation delay Dn to Qn 74F656A Waveform 1 2.0 2.5 4.0 5.5 6.5 7.0 2.0 2.5 7.0 7.5 2.0 2.5 8.0 9.0 ns ns tPLH tPHL Propagation delay Dn to ΣE, ΣO Waveform 1, 2 5.5 5.5 10.0 11.0 13.0 14.5 5.5 5.5 14.0 16.5 4.5 5.5 16.5 18.0 ns ns tPZH tPZL Output enable time to High or Low level Waveform 3 Waveform 4 3.5 4.0 7.0 8.0 10.5 11.0 3.5 4.5 11.5 12.0 3.0 4.0 13.0 13.5 ns ns tPHZ tPLZ Output disable time from High or Low level Waveform 3 Waveform 4 1.5 2.0 4.5 5.0 8.0 8.0 1.5 2.0 9.0 9.0 1.5 1.5 10.0 10.0 ns ns |
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