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W3DG6463V7D2-X Datasheet(PDF) 7 Page - White Electronic Designs Corporation |
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W3DG6463V7D2-X Datasheet(HTML) 7 Page - White Electronic Designs Corporation |
7 / 10 page July 2005 Rev. 2 W3DG6463V-D2 7 White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com White Electronic Designs PRELIMINARY White Electronic Designs Corp. reserves the right to change products or specifications without notice. Notes 1. All voltages referenced to VSS. 2. This parameter is sampled. VCC, VCCQ = +3.3V; TA = 25°C; pin under test biased at 1.4V; f = 1 MHz. 3. IDD is dependent on output loading and cycle rates. Specified values are obtained with mini-mum cycle time and the outputs open. 4. Enables on-chip refresh and address counters. 5. The minimum specifications are used only to indicate cycle time at which proper operation over the full temperature range is ensured. 6. An initial pause of 100µs is required after power-up, followed by two AUTO REFRESH commands, before proper device operation is ensured. (VCC and VCCQ must be powered up simultaneously. VSS and VSSQ must be at same potential.) The two AUTO REFRESH command wake-ups should be repeated any time the tREF refresh requirement is exceeded. 7. AC characteristics assume tT = 1ns. 8. In addition to meeting the transition rate specification, the clock and CKE must transit between VIH and VIL (or between VIL and VIH) in a mono-tonic manner. 9. Outputs measured at 1.5V with equivalent load: Q 50pF 10. tHZ defines the time at which the output achieves the open circuit condition; it is not a reference to VOH or VOL. The last valid data element will meet tOH before going High-Z. 11. AC timing and IDD tests have VIL = 0V and VIH = 3V with timing referenced to 1.5V crossover point. If the input transition time is longer than 1ns, then the timing is referenced at VIL (MAX) and VIH (MIN) and no longer at the 1.5V crossover point. 12. Other input signals are allowed to transition no more than once every two clocks and are other-wise at valid VIH or VIL levels. 13. IDD specifications are tested after the device is properly initialized. 14. Timing actually specified by tCKS; clock(s) specified as a reference only at minimum cycle rate. 15. Timing actually specified by tWR plus tRP; clock(s) specified as a reference only at minimum cycle rate. 16. Timing actually specified by tWR. 17. Required clocks are specified by JEDEC functionality and are not dependent on any timing parameter. 18. The IDD current will increase or decrease proportionally according to the amount of frequency alteration for the test condition. 19. Address transitions average one transition every two clocks. 20. CLK must be toggled a minimum of two times during this period. 21. Based on tCK = 10ns for 10, and tCK = 7.5ns for 7 and 7.5. 22. VIH overshoot: VIH (MAX) = VCCQ + 2V for a pulse width ≤ 3ns, and the pulse width cannot be greater than one third of the cycle rate. VIL under-shoot: VIL (MIN) = -2V for a pulse width ≤ 3ns. 23. The clock frequency must remain constant (stable clock is defined as a signal cycling within timing constraints specified for the clock pin) during access or precharge states (READ, WRITE, including tWR, and PRECHARGE commands). CKE may be used to reduce the data rate. 24. Auto precharge mode only. The precharge timing budget (tRP) begins 7ns for 7; 7.5ns for 7.5 and 7.5ns for 10 after the first clock delay, after the last WRITE is executed. May not exceed limit set for precharge mode. 25. Precharge mode only. 26. JEDEC and PC133, PC100 specify three clocks. 27. tAC for 7/7.5 at CL = 3 with no load is 4.6ns and is guaranteed by design. 28. Parameter guaranteed by design. |
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