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W3E232M16S-200STCG Datasheet(PDF) 4 Page - White Electronic Designs Corporation |
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W3E232M16S-200STCG Datasheet(HTML) 4 Page - White Electronic Designs Corporation |
4 / 22 page W3E232M16S-XSTX 4 White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com White Electronic Designs December 2005 Rev. 1 White Electronic Designs Corp. reserves the right to change products or specifications without notice. PRELIMINARY* bandwidth by hiding row precharge and activation time. An auto refresh mode is provided, along with a power- saving power-down mode. All inputs are compatible with the Jedec Standard for SSTL_2. All full drive options outputs are SSTL_2, Class II compatible. FUNCTIONAL DESCRIPTION Read and write accesses to the DDR SDRAM are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an ACTIVE command which is then followed by a READ or WRITE command. The address bits registered coincident with the ACTIVE command are used to select the bank and row to be accessed (BA0 and BA1 select the bank, A0-12 select the row). The address bits registered coincident with the READ or WRITE command are used to select the starting column location for the burst access. Prior to normal operation, the DDR SDRAM must be initialized. The following sections provide detailed information covering device initialization, register definition, command descriptions and device operation. INITIALIZATION DDR SDRAMs must be powered up and initialized in a predefined manner. Operational procedures other than those specified may result in undefined operation. Power must first be applied to VCC and VCCQ simultaneously, and then to VREF (and to the system VTT). VTT must be applied after VCCQ to avoid device latch-up, which may cause permanent damage to the device. VREF can be applied any time after VCCQ but is expected to be nominally coincident with VTT. Except for CKE, inputs are not recognized as valid until after VREF is applied. CKE is an SSTL_2 input but will detect an LVCMOS LOW level after VCC is applied. After CKE passes through VIH, it will transition to an SSTL_2 signal and remain as such until power is cycled. Maintaining an LVCMOS LOW level on CKE during power- up is required to ensure that the DQ and DQS outputs will be in the High-Z state, where they will remain until driven in normal operation (by a read access). After all power supply and reference voltages are stable, and the clock is stable, the DDR SDRAM requires a 200µs delay prior to applying an executable command. Once the 200µs delay has been satisfied, a DESELECT or NOP command should be applied, and CKE should GENERAL DESCRIPTION The 2x32Mx16 (1Gb) DDR SDRAM is a high-speed CMOS, dynamic random-access, memory using 2 chips containing 536,870,912 bits. Each chip is internally configured as a quad-bank DRAM. The 2x32Mx16 DDR SDRAM uses a double data rate architecture to achieve high-speed operation. The double data rate architecture is essentially a 2n-prefetch architecture with an interface designed to transfer two data words per clock cycle at the I/O pins. A single read or write access for the 2x32Mx16 DDR SDRAM effectively consists of a single 2n-bit wide, one-clock-cycle data tansfer at the internal DRAM core and two corresponding n-bit wide, one-half-clock-cycle data transfers at the I/O pins. A bi-directional data strobe (DQS) is transmitted externally, along with data, for use in data capture at the receiver. strobe transmitted by the DDR SDRAM during READs and by the memory contoller during WRITEs. DQS is edge- aligned with data for READs and center-aligned with data for WRITEs. Each chip has two data strobes, one for the lower byte and one for the upper byte. The 2x32Mx16 DDR SDRAM operates from a differential clock (CK and CK#); the crossing of CK going HIGH and CK# going LOW will be referred to as the positive edge of CK. Commands (address and control signals) are registered at every positive edge of CK. Input data is registered on both edges of DQS, and output data is referenced to both edges of DQS, as well as to both edges of CK.Read and write accesses to the DDR SDRAM are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an ACTIVE command, which is then followed by a READ or WRITE command. The address bits registered coincident with the ACTIVE command are used to select the bank and row to be accessed. The address bits registered coincident with the READ or WRITE command are used to select the bank and the starting column location for the burst access. The DDR SDRAM provides for programmable READ or WRITE burst lengths of 2, 4, or 8 locations. An auto precharge function may be enabled to provide a self- timed row precharge that is initiated at the end of the burst access. The pipelined, multibank architecture of DDR SDRAMs allows for concurrent operation, thereby providing high effective |
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