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White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com

White Electronic Designs

WSF128K32-XH2X

October 2004

Rev. 4

White Electronic Designs Corp. reserves the right to change products or specifications without notice.

PRELIMINARY

I

Current Source

D.U.T.

C

= 50 pf

eff

V ≈ 1.5V

(Bipolar Supply)

Z

Current Source

OH

SRAM AC CHARACTERISTICS

Parameter

Read Cycle

Symbol

-25

Units

Min

Max

Read Cycle Time

25

ns

Address Access Time

25

ns

Output Hold from Address Change

0ns

Chip Select Access Time

25

ns

Output Enable to Output Valid

15

ns

Chip Select to Output in Low Z

3ns

Output Enable to Output in Low Z

0ns

Chip Disable to Output in High Z

12

ns

Output Disable to Output in High Z

12

ns

1. This parameter is guaranteed by design but not tested.

SRAM AC CHARACTERISTICS

Parameter

Write Cycle

Symbol

-25

Units

Min

Max

Write Cycle Time

25

ns

Chip Select to End of Write

20

ns

Address Valid to End of Write

20

ns

Data Valid to End of Write

15

ns

Write Pulse Width

20

ns

Address Setup Time

3ns

Address Hold Time

0ns

Output Active from End of Write

3ns

Write Enable to Output in High Z

15

ns

Data Hold from Write Time

0ns

1. This parameter is guaranteed by design but not tested.

FIGURE 2 – AC TEST CIRCUIT

AC Test Conditions

Parameter

Typ

Unit

Input Pulse Levels

V

Input Rise and Fall

5

ns

Input and Output Reference Level

1.5

V

Output Timing Reference Level

1.5

V

Notes:

Tester Impedance Z0 = 75 Ω.

ATE tester includes jig capacitance.