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74LV74PW Datasheet(PDF) 4 Page - NXP Semiconductors |
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74LV74PW Datasheet(HTML) 4 Page - NXP Semiconductors |
4 / 12 page Philips Semiconductors Product specification 74LV74 Dual D-type flip-flop with set and reset; positive edge-trigger 1998 Apr 20 4 LOGIC DIAGRAM (ONE FLIP-FLOP) Q Q C C C C C C C C D C C RD SD CP SV00334 RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER CONDITIONS MIN TYP. MAX UNIT VCC DC supply voltage See Note1 1.0 3.3 5.5 V VI Input voltage 0 – VCC V VO Output voltage 0 – VCC V Tamb Operating ambient temperature range in free air See DC and AC characteristics –40 –40 +85 +125 °C tr, tf Input rise and fall times except for Schmitt-trigger inputs VCC = 1.0V to 2.0V VCC = 2.0V to 2.7V VCC = 2.7V to 3.6V VCC = 3.6V to 5.5V – – – – – – – – 500 200 100 50 ns/V NOTE: 1. The LV is guaranteed to function down to VCC = 1.0V (input levels GND or VCC); DC characteristics are guaranteed from VCC = 1.2V to VCC = 5.5V. ABSOLUTE MAXIMUM RATINGS1, 2 In accordance with the Absolute Maximum Rating System (IEC 134) Voltages are referenced to GND (ground = 0V) SYMBOL PARAMETER CONDITIONS RATING UNIT VCC DC supply voltage –0.5 to +7.0 V ±IIK DC input diode current VI < –0.5 or VI > VCC + 0.5V 20 mA ±IOK DC output diode current VO < –0.5 or VO > VCC + 0.5V 50 mA ±IO DC output source or sink current – standard outputs –0.5V < VO < VCC + 0.5V 25 mA ±IGND, ±ICC DC VCC or GND current for types with –standard outputs 50 mA Tstg Storage temperature range –65 to +150 °C Power dissipation per package for temperature range: –40 to +125 °C Ptt –plastic DIL above +70 °C derate linearly with 12mW/K 750 mW Ptot –plastic mini-pack (SO) above +70 °C derate linearly with 8 mW/K 500 mW –plastic shrink mini-pack (SSOP and TSSOP) above +60 °C derate linearly with 5.5 mW/K 400 NOTES: 1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed. |
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