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IDT71P74604S200BQ Datasheet(PDF) 11 Page - Integrated Device Technology

Part # IDT71P74604S200BQ
Description  18Mb Pipelined QDR II SRAM Burst of 4
Download  22 Pages
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Manufacturer  IDT [Integrated Device Technology]
Direct Link  http://www.idt.com
Logo IDT - Integrated Device Technology

IDT71P74604S200BQ Datasheet(HTML) 11 Page - Integrated Device Technology

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IDT71P74204 (2M x 8-Bit), 71P74104 (2M x 9-Bit), 71P74804 (1M x 18-Bit) 71P74604 (512K x 36-Bit)
Advance Information
18 Mb QDR II SRAM Burst of 4
Commercial Temperature Range
DC Electrical Characteristics Over the Operating Temperature and
Supply Voltage Range (VDD = 1.8 ± 100mV, VDDQ = 1.4V to 1.9V)
Param eter
Sym bol
Test Conditions
Min
Max
Unit
Note
Input Le akage Current
IIL
V DD = Max V IN = VSS to VDD Q
-10
+10
µA
Outp ut Le akag e Curre nt
IOL
Outp ut Disabled
-10
+10
µA
Operating Current
(x36,x18,x 9,x 8): DDR
IDD
V DD = Max ,
IOUT = 0m A (o utputs o pen),
Cyc le Tim e > tKH KH Min
333M HZ
-
TB D
mA
1
300M HZ
-
TB D
250M HZ
-
TB D
300M Hz
-
TB D
167M Hz
-
TB D
S tand b y Curre nt: NOP
ISB1
De vice De s e le cte d (in NOP state )
IOUT = 0m A (o utputs o pen),
f=M ax,
A ll Inp uts <0.2V o r > V DD -0.2V
333M HZ
-
TB D
mA
2
300M HZ
-
TB D
250M HZ
-
TB D
200M Hz
-
TB D
167M Hz
-
TB D
Outp ut Hig h Vo ltag e
V OH1
RQ = 250
Ω, IOH = -15mA
V DD Q /2-0.12
V DD Q /2+0.12
V
3,7
Outp ut Lo w Vo ltag e
V OL1
RQ = 250
Ω, IOL = 15mA
V DD Q /2-0.12
V DD Q /2+0.12
V
4,7
Outp ut Hig h Vo ltag e
V OH2
IOH = -0.1mA
V DD Q -0.2
V DD Q
V
5
Outp ut Lo w Vo ltag e
V OL2
IOL = 0.1m A
V SS
0.2
V
6
6111 tb l 10 c
NOTES:
1. Operating Current is measured at 100% bus utilization.
2. Standby Current is only after all pending read and write burst operations are completed.
3. Outputs are impedance-controlled. IOH = -(VDDQ/2)/(RQ/5) and is guaranteed by device characterization for 175
Ω < RQ < 350Ω. This
parameter is tested at RQ = 250
Ω, which gives a nominal 50Ω output impedance.
4. Outputs are impedance-controlled. IOL = (VDDQ/2)/(RQ/5) and is guaranteed by device characterization for 175
Ω < RQ < 350Ω. This
parameter is tested at RQ = 250
Ω, which gives a nominal 50Ω output impedance.
5. This measurement is taken to ensure that the output has the capability of pulling to the VDDQ rail, and is not intended to be used as an
impedance measurement point.
6. This measurement is taken to ensure that the output has the capability of pulling to Vss, and is not intended to be used as an impedance
measurement point.
7. Programmable Impedance Mode.


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