IDT71V25781S166PF datasheet(9/23 Pages) IDT

Part #	IDT71V25781S166PF

Description	128K X 36, 256K X 18 3.3V Synchronous SRAMs 2.5V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect

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Manufacturer	IDT [Integrated Device Technology]

Direct Link	http://www.idt.com

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9 / 23 page

6.42

IDT71V25761, IDT71V25781, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with

2.5V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect

Commercial and Industrial Temperature Ranges

9

DC Electrical Characteristics Over the Operating

Temperature and Supply Voltage Range(1)

DC Electrical Characteristics Over the Operating

Temperature and Supply Voltage Range (VDD = 3.3V ± 5%)

Figure 2. Lumped Capacitive Load, Typical Derating

Figure 1. AC Test Load

AC Test Load

AC Test Conditions

(VDDQ = 2.5V)

NOTE:

1. The

LBO pin will be internally pulled to VDD if it is not actively driven in the application and the ZZ pin will be internally pulled to VSS if not actively driven.

NOTES:

1. All values are maximum guaranteed values.

2. At f = fMAX, inputs are cycling at the maximum frequency of read cycles of 1/tCYC while

ADSC = LOW; f=0 means no input lines are changing.

3. For I/Os VHD = VDDQ - 0.2V, VLD = 0.2V. For other inputs VHD = VDD - 0.2V, VLD = 0.2V.

VDDQ/2

50

Ω

I/O

Z0 =50

Ω

5297 drw 06

,

1

2

3

4

20 30 50

100

200

∆tCD

(Typical, ns)

Capacitance (pF)

80

5

6

5297 drw 07

,

Symbol

Parameter

Test Conditions

Min.

Max.

Unit

|ILI|

Input Leakage Current

VDD = Max., VIN = 0V to VDD

___

5µA

|ILZZ|

ZZ and

LBO Input Leakage Current(1)

VDD = Max., VIN = 0V to VDD

___

30

µA

|ILO|

Output Leakage Current

VOUT = 0V to VDDQ, Device Deselected

___

5µA

VOL

Output Low Voltage

IOL = +6mA, VDD = Min.

___

0.4

V

VOH

Output High Voltage

IOH = -6mA, VDD = Min.

2.0

___

V

5297 tbl 08

Symbol

Parameter

Test Conditions

200MHz

183MHz

166MHz

Unit

Com'l Only

Com'l

Ind

Com'l

Ind

IDD

Operating Power Supply

Current

Device Selected, Outputs Open, VDD = Max.,

VDDQ = Max., VIN > VIH or < VIL, f = fMAX(2)

360

340

350

320

330

mA

ISB1

CMOS Standby Power

Supply Current

Device Deselected, Outputs Open, VDD = Max.,

VDDQ = Max., VIN > VHD or < VLD, f = 0(2,3)

30

35

30

35

mA

ISB2

Clock Running Power

Supply Current

Device Deselected, Outputs Open, VDD = Max.,

VDDQ = Max., VIN > VHD or < VLD, f = fMAX(2,3)

130

120

130

110

120

mA

IZZ

Full Sleep Mode Supply

Current

ZZ > VHD, VDD = Max.

30

35

30

35

mA

5297 tbl 09

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

Output Timing Reference Levels

AC Test Load

0 to 2.5V

2ns

(VDDQ/2)

See Figure 1

5297 tbl 10

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