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B32560-J8332-M Datasheet(PDF) 9 Page - Siemens Semiconductor Group |
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B32560-J8332-M Datasheet(HTML) 9 Page - Siemens Semiconductor Group |
9 / 16 page Siemens Matsushita Components 61 MKT Technical data Climatic category in accordance with IEC 68-1 55/100/561) Lower category temperature Tmin Upper category temperature Tmax − 55 °C + 100 °C (+ 125 °C for 1000 h and V C = 0,5 ⋅ VR) Damp heat test 56 days/40 °C/93 % relative humidity Limit values after damp heat test1) Capacitance change | ∆C/C| ≤ 5 % Dissipation factor change ∆ tan δ≤ 3 ⋅ 10−3 (at 1 kHz) ≤ 5 ⋅ 10−3 (at 10 kHz) Insulation resistance Ris ≥ 50 % of minimum or time constant τ = C R ⋅ Ris as-delivered values Reliability: Reference conditions Failure rate 0,5 ⋅ V R; 40 °C 2 ⋅10−9/h = 2 fit For a conversion table for other operating conditions and tem- peratures, refer to page 276. Service life 200 000 h Failure criteria: Total failure Failure due to variation of parameters Short circuit or open circuit Capacitance change | ∆C/C| > 10 % Dissipation factor tan δ> 2 ⋅ upper limit value Insulation resistance Ris < 150 MΩ (C R ≤ 0,33 µF) or time constant τ = C R ⋅ Ris < 50 s ( CR > 0,33 µF) DC test voltage 1,4 ⋅ V R, 2 s Category voltage VC Operation with dc voltage or ac voltage Vrms up to 60 Hz T ≤ 85 °C: V C = 1,0 ⋅ VR or 1,0 ⋅ Vrms T ≤ 100 °C: V C = 0,8 ⋅ VR or 0,8 ⋅ Vrms Category voltage for short operating periods T ≤ 100 °C: V C = 1,25 ⋅ VR or 1,0 ⋅ Vrms for max. 2000 h T ≤ 125 °C: V C = 0,5 ⋅ VR or 0,5 ⋅ Vrms for max. 1000 h Dissipation factor tan δ (in 10−3) at 20 °C (upper limit values) Insulation resistance Ris or time constant τ = C R ⋅ Ris at 20 °C, rel. humidity ≤ 65 % (minimum as-delivered values) 1) According to CECC 30401-007, test criteria must be met after exposure to damp heat for 21 days. CR ≤ 0,1 µF 0,1 µF < CR ≤ 1 µF CR > 1 µF at 1 kHz 8 8 10 10 kHz 15 15 – 100 kHz 30 – – VR CR ≤ 0,33 µF CR > 0,33 µF ≤ 100 Vdc 3750 M Ω 1250 s ≥ 250 Vdc 7500 M Ω 2500 s B 32 560 … B 32 564 |
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