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MC10H680FNG Datasheet(PDF) 3 Page - ON Semiconductor |
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MC10H680FNG Datasheet(HTML) 3 Page - ON Semiconductor |
3 / 10 page MC10H680, MC100H680 http://onsemi.com 3 Table 3. MAXIMUM RATINGS Parameter Symbols Rating Unit Power Supply Voltage VEE (ECL) −8.0 to 0 Vdc Power Supply Voltage VCCT (TTL) −0.5 to +7.0 Vdc Input Voltage VI (ECL) VI (TTL) 0.0 to VEE −0.5 to +7.0 Vdc Disabled 3−State Output Vout (TTL) 0.0 to VCCT Vdc Output Source Current Continuous Iout (ECL) 100 mAdc Output Source Current Surge Iout (ECL) 200 mAdc Storage Temperature Tstg −65 to 150 °C Operating Temperature Tamb 0.0 to +75 °C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. Table 4. DC CHARACTERISTICS, ECL VCCT = +5.0 V ± 10%, VEE = −5.2 ± 5% (10H Version); VEE = −4.2 V to −5.5 V (100H Version) Symbol TA = 0°C TA = 25°C TA = 75°C Parameter Condition Min Max Min Max Min Max Unit IEE Supply Current/ECL −110 −110 −110 mA IINH Input HIGH Current 255 175 175 mA IINL Input LOW Current 0.5 0.5 0.3 mA VOH VOL Output HIGH Voltage Output LOW Voltage 25 W to −2.1 V −1100 −2.1 −840 −2.03 −1100 −2.1 −810 −2.03 −1100 −2.1 −735 −2.03 mV V NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. Table 5. 10H DC CHARACTERISTICS (CONTROL INPUTS ONLY), ECL VCCT = +5.0 ± 10%, VEE = −5.2 ± 5% Symbol TA = 05C TA = 255C TA = 755C Parameter Min Max Min Max Min Max Unit VIH VIL Input HIGH Voltage Input LOW Voltage −1170 −1950 −840 −1480 −1130 −1950 −810 −1480 −1070 −1950 −735 −1450 mV NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. |
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